16th International Workshop on Physics of Semiconductor Devices 2012
DOI: 10.1117/12.926991
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Influence of small variation in impact ionization rate data on simulation of 4H-SiC IMPATT

Abstract: Material parameters like ionization rate coefficients for electrons and holes play important role in determining the performance of IMPATT device. Accuracy of these material data is significant for the quality of simulation results. In this paper, the influence of small variation in the ionization rate data on the performance of 4H-SiC IMPATT diode has been presented using our computer simulation program.Simulation, IMPATT, SiC and ionization rate

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