2013
DOI: 10.1007/s10853-013-7846-z
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Influence of roughness on the efficacy of grazing incidence X-ray diffraction to characterize grinding-induced phase changes in yttria-tetragonal zirconia polycrystals (Y-TZP)

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Cited by 12 publications
(9 citation statements)
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“…Larger incidence angles result in deeper x-ray penetration, giving information on subsurface phases. 32,52 In this study, a series of GIXRD profiles were performed at incidence angles from 1°to 9°and showed that the intensity of the diffraction peak of the monoclinic phase decreased as the penetration depth increased; however, the maximum GIXRD incidence angle is 9°, which corresponds to a penetration depth of 5.06 μm. Thus, semi-log linear regression protocols were used to extrapolate the full depth of phase transformation.…”
Section: Discussionmentioning
confidence: 82%
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“…Larger incidence angles result in deeper x-ray penetration, giving information on subsurface phases. 32,52 In this study, a series of GIXRD profiles were performed at incidence angles from 1°to 9°and showed that the intensity of the diffraction peak of the monoclinic phase decreased as the penetration depth increased; however, the maximum GIXRD incidence angle is 9°, which corresponds to a penetration depth of 5.06 μm. Thus, semi-log linear regression protocols were used to extrapolate the full depth of phase transformation.…”
Section: Discussionmentioning
confidence: 82%
“…GIXRD is a non‐destructive technique, which is able to characterize in‐depth phase composition as a function of incidence angle. Larger incidence angles result in deeper x‐ray penetration, giving information on subsurface phases . In this study, a series of GIXRD profiles were performed at incidence angles from 1° to 9° and showed that the intensity of the diffraction peak of the monoclinic phase decreased as the penetration depth increased; however, the maximum GIXRD incidence angle is 9°, which corresponds to a penetration depth of 5.06 μm.…”
Section: Discussionmentioning
confidence: 85%
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“…We interpret this phase to be zirconia as introduced by milling with zirconia beads during preparation process. A minor XRD reflection at 2θ ~30° in XRD patterns of YPO 4 ceramics (Figure 2A) may arise from this phase which was potentially formed during sintering by reaction of ZrO 2 with omnipresent Y to tetragonal Y-stabilized zirconia (Y-TZP; Strasberg et al, 2014).…”
Section: Resultsmentioning
confidence: 99%