Influence of Reflection of Photoelectrons From the Surface Photo-Emf in Thin Semiconductor Films and Compare It With the Bulk Photo-Emf

Abstract

Исследовано влияние отражения фотоэлектронов от поверхности на фотоЭДС в тонких полупроводниковых пленках и проведено ее сравнение с объемной фотоЭДС. Показано, что отраженная фотоЭДС может преобладать над объемной электродвижущей силой только в образцах с большой длиной свободного пробега при сильном поглощении света. В тонких пленках отраженная фотоЭДС, по-видимому, наблюдается вместе с другими видами фотоЭДС и при интерпретации результатов эксперимента может быть истолкована как объемная электродвижущая сила.

Temperature Dependence Of Energy States And Band Gap Broadening

“…Formula (5), as well as (12), determines the probability of filling the level with energy E, but this probability depends in this case also on the value 0 E ... The parameter E0 depends on the T-temperature and t-time variables [8]. And when selecting for a given T, corresponding to t, the value of E0 becomes, as it were, independent of the temperature and becomes, in terms of this independent variable, it is possible to very simply differentiate (11) and ( 12):…”

“…[12] Results and Discussions The PS model has been studied in many literatures. In the particular case of an isotropic quadratic dispersion law, the density of energy states for energies lower than E can be determined as follows [6][7][8][9]:…”

Determination Of The Characteristics Of Polymer-Containing Electronic Elements Using A Mobile Device

“…Using the resulting conductivity at the expense of the resulting charge carriers, light-sensitive devices and devices for measuring the amount of radioactive radiation are made. [13]The formation of both equilibrium and unbalanced charge carriers depends in many respects on the degree of purity in the structure of the semiconductor material. This means that semiconductors are materials that have a certain conductivity at room temperature, in the range of (Om-1Sm-1), which in many respects depends on the structure of the substance, the type and amount of foreign matter, and external conditions.…”