2020
DOI: 10.3390/electronics9040620
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Influence of PWM Methods on Semiconductor Losses and Thermal Cycling of 15-kVA Three-Phase SiC Inverter for Aircraft Applications

Abstract: This paper presents the influence of different pulse width modulation (PWM) methods on losses and thermal stresses in SiC power modules used in a three-phase inverter. The variation of PWM methods directly impacts instantaneous losses on these semiconductors, consequently resulting in junction temperature swing at the fundamental frequency of the converter's output current. This thermal cycling can significantly reduce the lifetime of these components. In order to determine semiconductor losses, one needs to c… Show more

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Cited by 21 publications
(8 citation statements)
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References 16 publications
(27 reference statements)
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“…The iterative modeling approach is, on the other hand, only accurate if the device temperature oscillations in the steady-state system operation are small, so that temperature-dependent parameters in both the thermal and electrical domains can be treated as constant. It should be noted that even the iterative procedure is frequently skipped in the design optimization of power converters [18], [34], [45].…”
Section: Circuit-based Et Modeling With Switching Lossesmentioning
confidence: 99%
“…The iterative modeling approach is, on the other hand, only accurate if the device temperature oscillations in the steady-state system operation are small, so that temperature-dependent parameters in both the thermal and electrical domains can be treated as constant. It should be noted that even the iterative procedure is frequently skipped in the design optimization of power converters [18], [34], [45].…”
Section: Circuit-based Et Modeling With Switching Lossesmentioning
confidence: 99%
“…In the deformation contour plots, the edge of the solder layer obtained under the fixed constraint had a positive trapezoid shape, while the edge of the solder layer obtained under the non-fixed constraint had an inverted trapezoid shape (Figure 4a,c). Under the fixed or non-fixed constrain conditions, both the chip and solder layer should be in a shrinkage state from the initial stress-free state (150 • C) to the simulation end (25 • C) [32]. The solder layer apparently shrank more under the non-fixed constraint.…”
Section: Effects Of Boundary Conditionsmentioning
confidence: 99%
“…This requires calculating the RMS and average current in the MOSFET and the diode [14]. Losses also depend on the PWM control strategy, which was investigated in Reference [15].…”
Section: Semi-conductor Lossesmentioning
confidence: 99%