2011
DOI: 10.1016/j.spmi.2011.03.005
|View full text |Cite
|
Sign up to set email alerts
|

Influence of post-deposition annealing on the structural, optical and electrical properties of Li and Mg co-doped ZnO thin films deposited by sol–gel technique

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
12
0

Year Published

2011
2011
2020
2020

Publication Types

Select...
9
1

Relationship

0
10

Authors

Journals

citations
Cited by 38 publications
(13 citation statements)
references
References 24 publications
1
12
0
Order By: Relevance
“…Sharp fundamental absorption edges, which correspond to an electronic transition of the films, were observed in the UV range at about 375 nm. The absorption edge of the films was shifted towards longer wavelengths by the annealing; this could be due to the crystallinity improvement of the films [23] because thermally-driven recrystallization can enhance the crystal quality of the films [24]. This is consistent with the result in the inset of Fig.…”
Section: Methodssupporting
confidence: 86%
“…Sharp fundamental absorption edges, which correspond to an electronic transition of the films, were observed in the UV range at about 375 nm. The absorption edge of the films was shifted towards longer wavelengths by the annealing; this could be due to the crystallinity improvement of the films [23] because thermally-driven recrystallization can enhance the crystal quality of the films [24]. This is consistent with the result in the inset of Fig.…”
Section: Methodssupporting
confidence: 86%
“…1(c). The changes in FWHM can be correlated to the grain sizes [14]; the smaller FWHM indicates a larger grain size and a better crystal quality, which may be due to the recrystallization process with sufficient thermal energy supply.…”
Section: X-ray Diffractionmentioning
confidence: 99%
“…Doped ZnO films are generally deposited by pulsed laser deposition (PLD) [44][45][46][47][48], magnetron co-sputtering [49][50][51][52][53][54][55], including direct current (DC) reactive and radio-frequency (RF), molecular beam epitaxy (MBE) [56][57][58][59][60], chemical vapor deposition [61,62] and sol-gel methods [63][64][65][66][67]. It is known that piezoelectricity is related to the crystallographic quality of ZnO films and high c-axis orientation can lead to good piezoelectricity of ZnO films [68][69][70][71][72].…”
Section: Film Growth Of Tm-doped Znomentioning
confidence: 99%