Influence of post-annealing on electrical, structural and optical properties of vanadium oxide thin films

Öksüzoğlu, Ramis Mustafa; Bilgiç, Pınar; Yıldırım, Mustafa; Deniz, Okan

doi:10.1016/j.optlastec.2012.10.001

Cited by 61 publications

(16 citation statements)

References 30 publications

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“…The optical absorption coefficient determined from the measured transmittance spectrum for grown vanadium oxide thin films showed a better fit when (h) 2/3 vs h were plotted revealing direct forbidden optical band gap. The evaluated optical band gap was 2.42 eV which is in good agreement with the reported value for nanocrystallineV 2 O 5 thin films [27].…”

Section: Results and Discussion Microstructural Propertiessupporting

confidence: 90%

“…Moreover, the low crystallite size of thin films provide high surface-to-volume ratio, which causes shorten charge transfer distance, suppress irreversible phase transition and lead to significant improvement of cycling stability, storage capacity and electrochemical kinetics. The lattice parameters of the films deposited at 250 ˚C are a = 1.151 nm, b = 0.354 nm and c = 0.437 nm, which are in good agreement with the reported values [26][27][28][29][30]. Fig.2 shows the Raman spectrum of V 2 O 5 thin films deposited at 250 ˚C in the wavelength range of 100-1200 cm -1 .…”

Section: Results and Discussion Microstructural Propertiessupporting

confidence: 87%

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Structural And Supercapacitive Performance Of V2O5 Thin Films Prepared By DC Magnetron Sputtering

Sandhya¹,

Dhananjaya²,

Guruprakash³

et al. 2017

IOSR JAC

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Nanocrystalline V 2 O 5 thin films were deposited by dc-magnetron sputtering at various substrate temperatures keeping O 2 to Ar ratio at 1:8. The microstructural features were studied by XRD and Raman measurements while the surface topography and grain size of the films by AFM. The films deposited at 250 ˚C exhibited predominant (001) orientation representing the orthorhombic crystal structure with Pmmn space group. The observation of well resolved vanadyle mode at 993 cm-1 and very strong vibrational mode at 142cm-1 in Raman spectrum confirms the formation of layered like structure. The surface of the film is comprised of nanocrystallites with an average grain size of 32 nm and surface roughness of 14 nm. The V 2 O 5 thin films deposited on Ni substrates exhibited good electrochemical performance with high specific capacitance of 238 F/g current density of 1 mAcm-2 with good cycling stability.

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Section: Results and Discussion Microstructural Propertiessupporting

confidence: 90%

Section: Results and Discussion Microstructural Propertiessupporting

confidence: 87%

Structural And Supercapacitive Performance Of V2O5 Thin Films Prepared By DC Magnetron Sputtering

Sandhya¹,

Dhananjaya²,

Guruprakash³

et al. 2017

IOSR JAC

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“…The variation in the resistance with different substrate temperatures is plotted in Figure 6. These plots are in good agreement with the thermal-activation mechanism evaluated with the following relation: 19 …”

Section: Dsupporting

confidence: 84%

Influence of the substrate temperature on the structural, optical and thermoelectric properties of sprayed V2O5 thin films

Vijayakumar¹,

Reddy²,

Moholkar³

2015

Mater. Tehnol.

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Vanadium pentoxide (V2O5) thin films were deposited using the spray pyrolysis technique. An aqueous solution of ammonium vanadate with a 0.05 M concentration was used for depositing V2O5 thin films at three different substrate temperatures on glass substrates. The structural and optical characteristics of the V2O5 thin films were examined with X-ray diffraction (XRD) and double-beam UV-visible spectrophotometry. The X-ray diffraction study of the V2O5 thin films revealed a polycrystalline nature of the orthorhombic structure with the preferred orientation of (001). The crystallite size (d) was calculated from the (001) diffraction peak using the Debye-Scherrer formula. From the optical absorbance measurements, the optical band gap (Eg) was determined. A scanning electron microscope (SEM) was used to characterize the morphology of the films. Electrical measurements of the films indicated that the resistance decreases with an increase in the substrate temperature. From the thermoelectric measurements, the Seebeck coefficient was determined. Keywords: V 2 O 5 thin film, spray pyrolysis, optical band gap, activation energy, temperature coefficient of resistance, Seebeck coefficient Tanka plast vanadijevega pentoksida (V2O5) je bila nanesena s tehniko piroliznega brizganja. Za nanos tanke plasti V2O5 na podlago iz stekla pri treh razli~nih temperaturah podlage je bila uporabljena koncentracija vodne raztopine amonijevega vanadata 0,05 M. Zna~ilnosti strukture in opti~ne zna~ilnosti tanke plastiV2O5 so bile preiskovane z rentgensko difrakcijo in z dvo`arkovno UV-vidno spektrofotometrijo. Rentgenska difrakcija tanke plasti V2O5 je odkrila polikristalno naravo ortorombi~ne strukture s prednostno orientacijo (001). Velikost kristalitov (d) je bila izra~unana iz difrakcijskega vrha (001) z Debye-Scherrerjevo formulo. Iz meritev opti~ne absorbance je bila dolo~ena pasovna vrzel (Eg). Za karakterizacijo morfologije plasti je bil uporabljen vrsti~ni elektronski mikroskop (SEM). Elektri~ne meritve tankih plasti so pokazale, da se upornost zmanj{uje z nara{~anjem temperature podlage. Iz termoelektri~nih meritev je bil dolo~en Seebeckov koeficient. Klju~ne besede: tanka plast V2O5, pirolizno brizganje, opti~na pasovna vrzel, aktivacijska energija, temperaturni koeficient upornosti, Seebeckov koeficient

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“…In the literature, there have been detailed investigations on the physical properties and gradual reduction of vanadium oxide by heating at high temperatures [29,50]. …”

Section: Resultsmentioning

confidence: 99%

“…On the other hand, some optoelectronic devices which are fabricated at high temperatures require developed metal oxides which must be able to keep their properties under high temperature fabrication processes. Whilst the optical and chemical properties of V 2 O x have previously been investigated after high-temperature annealing [29,30,31], its performance with OPVs has not. Therefore, our motivation for this work is to explore the impact of thermal heating on V 2 O x thin films as HELs in organic solar cells.…”

Section: Introductionmentioning

confidence: 99%

Thermally Stable Solution Processed Vanadium Oxide as a Hole Extraction Layer in Organic Solar Cells

et al. 2016

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Low-temperature solution-processable vanadium oxide (V2Ox) thin films have been employed as hole extraction layers (HELs) in polymer bulk heterojunction solar cells. V2Ox films were fabricated in air by spin-coating vanadium(V) oxytriisopropoxide (s-V2Ox) at room temperature without the need for further thermal annealing. The deposited vanadium(V) oxytriisopropoxide film undergoes hydrolysis in air, converting to V2Ox with optical and electronic properties comparable to vacuum-deposited V2O5. When s-V2Ox thin films were annealed in air at temperatures of 100 °C and 200 °C, OPV devices showed similar results with good thermal stability and better light transparency. Annealing at 300 °C and 400 °C resulted in a power conversion efficiency (PCE) of 5% with a decrement approximately 15% lower than that of unannealed films; this is due to the relative decrease in the shunt resistance (Rsh) and an increase in the series resistance (Rs) related to changes in the oxidation state of vanadium.

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Influence of post-annealing on electrical, structural and optical properties of vanadium oxide thin films

Cited by 61 publications

References 30 publications

Structural And Supercapacitive Performance Of V2O5 Thin Films Prepared By DC Magnetron Sputtering

Structural And Supercapacitive Performance Of V2O5 Thin Films Prepared By DC Magnetron Sputtering

Influence of the substrate temperature on the structural, optical and thermoelectric properties of sprayed V2O5 thin films

Thermally Stable Solution Processed Vanadium Oxide as a Hole Extraction Layer in Organic Solar Cells

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