2014
DOI: 10.1016/j.tsf.2014.07.021
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Influence of oxygen and argon flow on properties of aluminum-doped zinc oxide thin films prepared by magnetron sputtering

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Cited by 12 publications
(12 citation statements)
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“…In fact, due to a decrease in the argon sputtering yield, the film formation process is slowed down, providing sufficient time for Zn 2þ and O 2À ions to arrange in an ordered layer, so the crystalline film exhibits fewer defects and higher crystallinity. 46 However, due to the increase in the oxygen content, it is probable that the strong affinity between aluminum and oxygen can result in the formation of clusters of nonconducting aluminum oxide (such as Al 2 O 3 ). Such clusters could cause crystalline disorder in the coating and perform as carrier traps rather than electron donors.…”
Section: Resultsmentioning
confidence: 99%
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“…In fact, due to a decrease in the argon sputtering yield, the film formation process is slowed down, providing sufficient time for Zn 2þ and O 2À ions to arrange in an ordered layer, so the crystalline film exhibits fewer defects and higher crystallinity. 46 However, due to the increase in the oxygen content, it is probable that the strong affinity between aluminum and oxygen can result in the formation of clusters of nonconducting aluminum oxide (such as Al 2 O 3 ). Such clusters could cause crystalline disorder in the coating and perform as carrier traps rather than electron donors.…”
Section: Resultsmentioning
confidence: 99%
“…However, as no such clusters of nonconducting Al 2 O 3 were observed by XRD, this possibility can be ruled out. 46 The surface morphology and cross-sections of the AZO films were analyzed by SEM (Fig. 5), revealing a significant change in the surface morphology and thickness of the coating with increasing oxygen admixture in the argon gas.…”
Section: Resultsmentioning
confidence: 99%
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“…Aluminum-doped zinc oxide (ZAO) films are especially attractive materials among different oxide materials because of the abundance of raw materials, low cost, environmental friendliness, and stability in hydrogen plasma. The effects of the substrate temperature on the properties of ZnO thin films have been reported by many research groups [1][2][3] . ZAO film's quality and its photoelectric performance are affected by process parameters such as substrate temperature [4] , sputtering time [5] , sputtering power [6] , target-substrate distance, working pressure [7] , annealing temperature and annealing time [4,8] .…”
Section: Introductionmentioning
confidence: 95%