2013
DOI: 10.1016/j.measurement.2012.10.028
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Influence of non-ideal circumferential contacts on errors in the measurements of the resistivity of layers using the van der Pauw method

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Cited by 10 publications
(4 citation statements)
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“…As shown in figure 5, the effect of the electrode radian angle on CF is not significant, and CF is nearly equal to 1. Náhlík et al [32] reported this phenomenon and indicated that the width of circumferential contacts dose not affect the value of the measured resistivity under the equal length situation. shows the unequal length situation, and the electrode height is equal to 0.01H, where H is the cylinder height.…”
Section: Electrode Width Effectmentioning
confidence: 91%
“…As shown in figure 5, the effect of the electrode radian angle on CF is not significant, and CF is nearly equal to 1. Náhlík et al [32] reported this phenomenon and indicated that the width of circumferential contacts dose not affect the value of the measured resistivity under the equal length situation. shows the unequal length situation, and the electrode height is equal to 0.01H, where H is the cylinder height.…”
Section: Electrode Width Effectmentioning
confidence: 91%
“…If  ln(2) ( 3 − 4 ) = 2 does not hold, we can use equations [6] and [7] to calculate the contact resistances and deduce the intrinsic potentials V´i for the four corners. Having these potentials we can follow the procedure explained above.…”
Section: 1-theorymentioning
confidence: 99%
“…It can be applied to semiconductors and metals [ 25 , 26 , 27 ]. This method enables the determination of surface resistance or resistivity of a thin material coating or layer [ 28 , 29 ]. The technique is beneficial for measuring the properties of irregularly shaped pieces and complex structures like flat textile products [ 20 , 30 ].…”
Section: Introductionmentioning
confidence: 99%