2009
DOI: 10.1016/j.jallcom.2008.11.065
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Influence of nickel thickness on the properties of ITO/Ni/ITO thin films

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Cited by 42 publications
(11 citation statements)
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“…J. Park previously reported a similar result where a noble Ni interlayer enhanced the surface flatness of ITO/Ni/ITO trilayer films [8].…”
Section: (A) (B) (C) (D) (E)supporting
confidence: 56%
“…J. Park previously reported a similar result where a noble Ni interlayer enhanced the surface flatness of ITO/Ni/ITO trilayer films [8].…”
Section: (A) (B) (C) (D) (E)supporting
confidence: 56%
“…The RMS roughness of the GZO films was 1.8 nm, while GZO films with a 2 nm thick Ni inter layer showed a lower RMS roughness of 1.0 nm. Similarly, Park also reported that a Ni interlayer enhances the surface flatness of upper ITO films deposited with RF and DC magnetron sputtering at room temperature [11].…”
Section: Resultsmentioning
confidence: 72%
“…In a previous study, J. Park reported that a Ni interlayer in ITO/Ni/ITO multilayer films also promotes the flatness of the upper ITO films [8]. Table 2 shows the influence of the TiO 2 buffer layer on the electrical properties of the films.…”
Section: Resultsmentioning
confidence: 97%