Influence of Localized Hot Carrier Degradation in DSOI Device Operating in MOSFET and BJT Modes

Qian, Yijun; Gao, Yuan; Shukla, Amit Kumar; Wu, Tao; Mu, Zhiqiang; Lu, Kai; Dong, Yemin; Wei, Xing; Yang, Yumeng

doi:10.1109/edtm58488.2024.10511711

2024 8th IEEE Electron Devices Technology &Amp;amp; Manufacturing Conference (EDTM) 2024

DOI: 10.1109/edtm58488.2024.10511711

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Influence of Localized Hot Carrier Degradation in DSOI Device Operating in MOSFET and BJT Modes

Yijun Qian,

Yuan Gao,

Amit Kumar Shukla

et al.

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Influence of Localized Hot Carrier Degradation in DSOI Device Operating in MOSFET and BJT Modes

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References 7 publications

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