Abstract:Annular linear polarized light is used as the illumination source of the reflective dark-field detecting system in this paper. According to the theories of the Bidirectional Reflectance Distribution Function (BRDF) and multi-beam interference, the influence of the light polarization state on the intensity distribution of the scattering light is analyzed in detail. For surface defects, a simulation model of dark-field imaging is established based on the Finite-Difference Time-Domain method (FDTD). Both the near… Show more
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