Influence of lateral geometry on magnetoresistance and magnetisation reversal in Ni/sub 80/Fe/sub 20/ wires

Yao, C.C.; Hasko, D. G.; Lee, W.Y.; Hirohata, Atsufumi; Xu, Yongbing; Bland, J. A. C.

doi:10.1109/20.801007

Cited by 2 publications

(4 citation statements)

References 10 publications

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“…Both solid rhombus and solid rectangular chains were investigated previously by MFM and show flux closure domain configurations [11]. However, the current distribution needs to be considered in analyzing the MR behavior in these structures.…”

Section: Resultsmentioning

confidence: 99%

“…Both the diagonally con nected square (rhombus) chain and rectangular chain with wires form flux closure domain configurations with triangular shape domains at the corners. In particular, the rectangular chains create very clear and well defined domain walls connected to the corners of the structure, which corresponds to the walls observed in the modulated wire structures with extensions [11].…”

Section: Methodsmentioning

confidence: 99%

“…However, it is very difficult to detect very small resistivity signals related to a single domain wall. Therefore we have investigated the domain structures of periodically modulated wire structures with rhombus and rectangular extensions [11]. In such structures, the repetition of the domain walls should enable the domain wall contribution to the resistivity to be detected more easily.…”

Section: Methodsmentioning

confidence: 99%

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Magnetic domain studies of permalloy wire-based structures with junctions

et al. 2000

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Permalloy (Ni-80 Fe-20) wire-based structures (30 nm thick and 1 . w . 10 mum wide) with junctions (crosses, networks, H-shapes, rectangular chains and ring chains) prepared on a GaAs (100) substrate were observed in both their demagnetized and remanent states by magnetic force microscopy (MFM) in order to investigate the role of junction geometry in domain formation, Except in ring chains, two classes of domain configuration are found at the junction: (i) a domain wall-like feature due to abrupt spin rotation and (ii) a triangle-shape domain consistent with a flux closure configuration, Ring chains, on the other hand, form vortex domains at every other junction. The MFM observations are compared with micromagnetic calculations which qualitatively support the magnetic domain configurations

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Section: Resultsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

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Magnetic domain studies of permalloy wire-based structures with junctions

et al. 2000

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“…5 Similar effects have been measured in patterned wires when the MR was measured with an in-plane H applied parallel and perpendicular to the current direction. 6 Figure 4 shows the x-ray diffraction intensity, Cu K␣ 1 radiation, as a function of in-plane rotation angle for a permalloy film deposited on Si ͑111͒ and then subsequently momentarily annealed to 500°C. The 2 angle for this trace was 44.589°which is the 2 value for the permalloy ͑111͒ reflection.…”

Section: F J Cadieu A) and LI Chenmentioning

confidence: 99%

Ion deposited nanoscale permalloy and Co films generated from laser excitation

Cadieu

Chen

2004

Journal of Applied Physics

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A modified pulsed laser deposition system has been used to deposit permalloy and Co films from ions generated due to the impact of 248 nm excimer laser pulses. A synchronously pulsed magnetic field coil with a wide entrance throat and a tapered bore in conjunction with a set of permanent magnets has been used to capture and concentrate the ion and electron beam flux under vacuum conditions onto the substrates. Co and other films such as diamond like carbon (DLC) are strongly adherent when deposited onto even room temperature substrates. Permalloy films deposited onto Si (111) substrates with thicknesses from 10 to 50 nm exhibit anisotropic magnetoresistance of approximately 2% for magnetic fields applied in-plane parallel versus perpendicular to the current direction. Over 1 order of magnitude intensity modulation has been observed in x-ray reflectivity measurements for Co films, 7–15 nm thickness, deposited onto R-plane sapphire substrates and onto Si (111) substrates. In contrast to this Co films simultaneously deposited onto A-plane sapphire substrates hardly exhibited x-ray reflectivity fringes indicating a large surface roughness. Similarly DLC films deposited onto (111) Si substrates exhibited order of magnitude intensity modulations indicating a very small surface roughness. Scanning electron microscope measurements indicated smooth films were obtained with no discernible particulates.

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Influence of lateral geometry on magnetoresistance and magnetisation reversal in Ni/sub 80/Fe/sub 20/ wires

Cited by 2 publications

References 10 publications

Magnetic domain studies of permalloy wire-based structures with junctions

Magnetic domain studies of permalloy wire-based structures with junctions

Ion deposited nanoscale permalloy and Co films generated from laser excitation

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