2001
DOI: 10.1109/77.919465
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Influence of La-doping of YBa/sub 2/Cu/sub 3/O/sub 7/ on transport properties of interface-engineered ramp-edge junctions

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Cited by 9 publications
(13 citation statements)
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“…The values were obtained using the geometrical dimensions of the junctions. The obtained ratios are about the reported values for these types of the junctions with similar junction widths [13], [15]. As shown in the figure, the nonlinearity in the -curves became prominent as the junction widths increased to 8 m resulting in well above 4 [14].…”
Section: A -Characteristicsupporting
confidence: 77%
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“…The values were obtained using the geometrical dimensions of the junctions. The obtained ratios are about the reported values for these types of the junctions with similar junction widths [13], [15]. As shown in the figure, the nonlinearity in the -curves became prominent as the junction widths increased to 8 m resulting in well above 4 [14].…”
Section: A -Characteristicsupporting
confidence: 77%
“…The obtained values for the and of our samples are close and slightly better than the typical reported values [11], [13], [16]. While the of the junctions made on one chip decreased as the decreased, a systematic change of the was not observed.…”
Section: Similarsupporting
confidence: 72%
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“…2. The associated Steward McCumber parameter, [13], resulted in a junction capacitance of about 2 fF, below the expected typical reported values for Y-Ba-Cu-O GB JJs [14]- [16]. The relatively low capacitance and high values of our SEJs suggest effective junction areas much smaller than the "geometrical area" of the junctions [6], [9].…”
Section: Sej -Characteristics and Magnetic Field Dependencecontrasting
confidence: 63%