2002
DOI: 10.1103/physrevb.65.134436
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Influence of in-plane crystalline quality of an antiferromagnet on perpendicular exchange coupling and exchange bias

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Cited by 67 publications
(34 citation statements)
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“…This hints at the absence of magnetization rotation and corroborates the suspected DW nucleation and growth processes during switching near the coercive field. 8 Similar PNR data were observed on thin films of Fe exchange coupled to antiferromagnetic FeF 2 , 24 where a field close to the coercive field was applied parallel to the sample plane. The absence of SF signals during magnetization reversal was attributed to mere nucleation and growth processes of magnetic domains, which also applies to our SFM sample.…”
Section: ͑7͒supporting
confidence: 62%
“…This hints at the absence of magnetization rotation and corroborates the suspected DW nucleation and growth processes during switching near the coercive field. 8 Similar PNR data were observed on thin films of Fe exchange coupled to antiferromagnetic FeF 2 , 24 where a field close to the coercive field was applied parallel to the sample plane. The absence of SF signals during magnetization reversal was attributed to mere nucleation and growth processes of magnetic domains, which also applies to our SFM sample.…”
Section: ͑7͒supporting
confidence: 62%
“…Nogués et al [1] have shown that the exchange bias depends strongly on the spin structure at the interface and in particular, on the angle between the FM and AFM spins. Work by Fitzsimmons et al [18][19][20][21][22] using polarized neutron reflectometry and magnetometry show that spin configurations at the FeF2 interface differ from the bulk, and can be linked to exchange anisotropies and bias phenomena.…”
Section: T I S U S E F U L a T T H I S P O I N T T O S U M M A R I mentioning
confidence: 99%
“…The exact growth conditions have been reported in earlier studies. 13,22,23 The Fe layer thus prepared is polycrystalline, and grows similarly on MgO and FeF 2 .…”
mentioning
confidence: 99%
“…Notice that the magnitude of H E is one order of magnitude smaller than that in uniform Fe/FeF 2 bilayer films. 22,23 This is due to the exposed FeF 2 surface during the alumina mask application process, resulting in a contaminated Fe/FeF 2 interface. It further attests to the interfacial nature of EB.…”
mentioning
confidence: 99%
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