1992
DOI: 10.1016/0169-4332(92)90077-b
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Influence of hydrogen on the structure and surface morphology of pulsed ArF excimer laser crystallized amorphous silicon thin films

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Cited by 19 publications
(8 citation statements)
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“…The spike height at 1 or 100 pulses almost linearly increase with increasing of fluence. According to reference [17], the spike heights at 1 pulse are close to the experimental results. The average spike height of laser irradiated dehydrogenated aSi thin films (prepared by thermal annealing at 80 hours) at 0.4 J/cm 2 and 100 pulses is around 58 nm.…”
Section: Surface Topography On Dehydrogenated A-sisupporting
confidence: 53%
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“…The spike height at 1 or 100 pulses almost linearly increase with increasing of fluence. According to reference [17], the spike heights at 1 pulse are close to the experimental results. The average spike height of laser irradiated dehydrogenated aSi thin films (prepared by thermal annealing at 80 hours) at 0.4 J/cm 2 and 100 pulses is around 58 nm.…”
Section: Surface Topography On Dehydrogenated A-sisupporting
confidence: 53%
“…2.1, beyond the capillary waves formed by solidifying of the molten layer, hydrogen should play an important role in formation of the spikes. It is showed that the hydrogen atoms combine to form H 2 gas, and then diffuse into the ambient medium and leave the blister regions after laser processing [17]. However, a more complex process could occur, i.e., the combined hydrogen molecules may explode when the laser energy is high enough; subsequently, the released pressure drives the upper liquid silicon layer to move upwards while the surrounding liquid silicon flows to the explosion position.…”
Section: Surface Topography On Laser Irradiated A-si:hmentioning
confidence: 99%
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