Influence of growth time and substrate type on the microstructure and luminescence properties of ZnO thin films deposited by RF sputtering

Mendil, Djelloul; Challali, Fatiha; Touam, Tahar; Chelouche, A.; Souici, Abdelhafid; Ouhenia, Salim; Djouadi, D.

doi:10.1016/j.jlumin.2019.116631

Cited by 41 publications

(13 citation statements)

References 64 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…Similar temperature effects were reported in the AFM study by Prasada Rao et al [21]. The RMS roughness obtained for the ZnO thin films deposited with ultrasonic spray pyrolysis at 450 • C from a pH 4 solution compares well with values usually measured for ZnO films obtained by more complex techniques such as ion-beam or RF magnetron sputtering [52,53].…”

Section: Tablesupporting

confidence: 87%

Elaboration of high-transparency ZnO thin films by ultrasonic spray pyrolysis with fast growth rate

Bose

Chevallier

Hamady

et al. 2021

Superlattices and Microstructures

View full text Add to dashboard Cite

Section: Tablesupporting

confidence: 87%

Elaboration of high-transparency ZnO thin films by ultrasonic spray pyrolysis with fast growth rate

Bose

Chevallier

Hamady

et al. 2021

Superlattices and Microstructures

View full text Add to dashboard Cite

“…However, the presence of the amorphous ZnO phase cannot be ruled out a priori. The patterns of the sputtered ZnO thin films grown at room temperature show the characteristic peaks of hexagonal wurtzite structure, with strong (002) reflection, which indicates preferential growth orientation perpendicular to the substrate [ 33 , 34 , 35 , 36 ].…”

Section: Resultsmentioning

confidence: 99%

Surface Wettability of ZnO-Loaded TiO2 Nanotube Array Layers

et al. 2020

View full text Add to dashboard Cite

Herein we report on the synthesis and the effects of gradual loading of TiO2 nanotube array layers with ZnO upon surface wettability. Two-step preparation was chosen, where TiO2 nanotube layers, grown in a first instance by anodization of a Ti foil, were gradually loaded with controlled amounts of ZnO using the reactive RF magnetron sputtering. After crystallization annealing, the formerly amorphous TiO2 nanotubes were converted to predominantly anatase crystalline phase, as detected by XRD measurements. The as-prepared nanotubes exhibited a well-aligned columnar structure, 1.6 μm long and 88 nm in diameter, and a small concentration of oxygen vacancies. Ti2+ and Ti3+ occur along with the Ti4+ state upon sputter-cleaning the layer surfaces from contaminants. The Ti2+ and Ti3+ signals diminish with gradual ZnO loading. As demonstrated by the VB-XPS data, the ZnO loading is accompanied by a slight narrowing of the band gap of the materials. A combined effect of material modification and surface roughness was taken into consideration to explain the evolution of surface super-hydrophilicity of the materials under UV irradiation. The loading process resulted in increasing surface wettability with approx. 33%, and in a drastic extension of activation decay, which clearly points out to the effect of ZnO-TiO2 heterojunctions.

show abstract

“…The (002) peak position was 34.22° for as-deposited lms and it shifted to higher angles up to the 34.553° for the sample annealed at 450 °C. It is important to note that the 2θ value is 34.42° for stress-free bulk ZnO [35].…”

Section: Xrd Analysismentioning

confidence: 99%

Highly c-axis Oriented ZnO Thin Films by Sol-gel Method

Kutlu¹,

Erdogan²,

Sedefoğlu³

et al. 2021

Preprint

View full text Add to dashboard Cite

This study reports the effect of annealing temperature on the structural, morphological, and optical properties of ZnO (Zinc Oxide) thin films deposited on a glass substrate by the sol-gel spin coating method. Those properties of ZnO were examined with UV-Vis, Fourier transform infrared (FTIR) and Raman spectroscopy, Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), and X-ray diffraction (XRD), before and after annealing. XRD results revealed that all the samples had a highly c-axis oriented wurtzite structure. A 1 (LO) mode in Raman spectra also confirmed the highly oriented ZnO films. Optical measurement indicated that transmittance of the films was above %85, and the optical band gap slightly decreased with the increasing annealing temperature from 350 to 550 °C. Morphological analysis displayed that increasing annealing temperature improved surface morphology and enlarged the grain size from 2-3 nm for as-deposited samples to 150 nm for annealed at 550 °C.

show abstract

Influence of growth time and substrate type on the microstructure and luminescence properties of ZnO thin films deposited by RF sputtering

Cited by 41 publications

References 64 publications

Elaboration of high-transparency ZnO thin films by ultrasonic spray pyrolysis with fast growth rate

Elaboration of high-transparency ZnO thin films by ultrasonic spray pyrolysis with fast growth rate

Surface Wettability of ZnO-Loaded TiO2 Nanotube Array Layers

Highly c-axis Oriented ZnO Thin Films by Sol-gel Method

Contact Info

Product

Resources

About