2016
DOI: 10.1016/j.scriptamat.2015.10.004
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Influence of grain boundaries on the figure of merit of undoped and Al, In, Sn doped ZnO thin films for photovoltaic applications

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Cited by 41 publications
(8 citation statements)
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“…For the barrier height φ B , we first note that the obtained value ranges between 0.12 and 0.25 eV. These values are lower than the typical barrier height of 0.7 -0.9 eV observed at the grain boundaries of annealed ZnO[15,36], for which the doping in the grains is as low as 10 The low value can be explained by the high doping in ZnO nanowires due to intrinsic defects, as observed in ZnO thin film obtained by sol-gel, for which barrier height as low as 0.176 eV have been extracted[37].Figures 5(c) and 5(d) show that φ B depends both on W and L, which is surprising at first since the barrier height at each junction should not depend on the geometry of the network. The dependence in L shows first a decrease from 2 to 5 µm, and then is almost independent on L for spacing larger than 5 µm.…”
mentioning
confidence: 63%
“…For the barrier height φ B , we first note that the obtained value ranges between 0.12 and 0.25 eV. These values are lower than the typical barrier height of 0.7 -0.9 eV observed at the grain boundaries of annealed ZnO[15,36], for which the doping in the grains is as low as 10 The low value can be explained by the high doping in ZnO nanowires due to intrinsic defects, as observed in ZnO thin film obtained by sol-gel, for which barrier height as low as 0.176 eV have been extracted[37].Figures 5(c) and 5(d) show that φ B depends both on W and L, which is surprising at first since the barrier height at each junction should not depend on the geometry of the network. The dependence in L shows first a decrease from 2 to 5 µm, and then is almost independent on L for spacing larger than 5 µm.…”
mentioning
confidence: 63%
“…Salam et al reported that excessive doping of ZnO structure generates increased strain to the crystal structure and reduces the electron mobility, leading to enhanced resistivity [65]. Yildiz et al mentioned that conductivity reduction at high Sn concentrations (> 2 at.%) may be associated with carrier traps at grain boundaries [66]. Shelke et al reported that doping at a certain amount of dopant may form a film with less compressive stress and enhanced conductivity [67].…”
Section: Conductivity and Resistivity Measurementmentioning
confidence: 99%
“…Sn can also be used as a dopant in ZnO, where the Zn 2+ ion is replaced by the Sn 4+ ion, to increase the carrier concentration [19,20]. Compared with other TCOs, Sn-doped ZnO exhibits reduced conductivity owing to the high mean barrier height depending on disorder of grain boundary [21]. The ionic radii of Ga (0.062 nm) and Zn (0.074 nm) and covalent bond length of Ga-O (1.92 Å) and Zn-O (1.97 Å) are similar, resulting in low deformation of the ZnO lattice even at a high doping concentration [7,[22][23][24].…”
Section: Introductionmentioning
confidence: 99%