Influence of Electrically Large Structures on the EMC-Compliance of a Semi-Anechoic Chamber

Hofmann, Willi; Bornkessel, Christian; Hein, Matthias

doi:10.1109/icmim.2018.8443499

Cited by 2 publications

(2 citation statements)

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“…Studies and Applications [44] Characterizing the reflection coefficient of RAM using time domain technique [45] Evaluation of AC using matrix pencil technique [46] Contributions of site for radiated emission measurement Uncertainties more than 1 GHz [47] Laptop emission [48] Effect of electrically large structures on the EMC compliance [49] Single probe anechoic chamber technique for MIMO OTA measurement [50] Radiation pattern measurement for modulated metasurface antenna [51] Radiation pattern measurement for wideband lowsidelobe short array antenna [52] Radiation pattern measurement for arbitrary phased array system [53] Testing the effectiveness of the shared tower scale model [54] Radiation pattern measurement for monopole antenna with the periodic patch director [55] Validation of connector emission measurement [56] Simulations of automotive EMC [57] Effect of table material on radiated immunity Test [58] Radiated emissions measurement from an automotive cluster…”

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confidence: 99%

“…EMI radiation from the laptop was assessed in the frequency domain with a frequency of 30 MHz to 1 GHz, compliant with the CISPR 22 Standard.Hofmann et.al studied the effect of broad electrical structure on the EMC-compliance of a semi-anechoic chamber[34]. A semi-anechoic chamber was used for evaluating the impact of large and permanently mounted objects on the propagation conditions[48]. Table3presents several studies and applications of AC.…”

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A review of measurement of electromagnetic emission in electronic product: Techniques and challenges

Yuwono

Baharuddin

Misran

et al. 2022

CST

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Nowadays, electronic products are being used extensively in many fields and applications. The dense population of electronic devices in human life has become a challenge for microwave engineers to ensure that their products can meet the Electromagnetic Compatibility (EMC) standards. Complex electronic products with smaller sizes and denser components will be a challenge for compliance with EMC standards. In addition, the occurrence of non-stationary emission at certain operating modes becomes a challenge for analysis. Error in analyzing EM emissions will make the products unable to meet the requirements of EMC standards; hence, they will be prohibited to be marketed. Currently, there are two methods of emission analysis, i.e. by measurement and modeling or computation. There are some problems, however, in the analysis of EM emissions regarding the area of test, complexity, DUT positioning error, installation cost, and time consumption. In this paper, the analysis techniques for EM emissions including Open Area Test Site (OATS), Anechoic chamber, Transverse Electromagnetics TEM Cell, Compact Antenna Test Range (CATR) and near field scanning are reviewed comprehensively. This survey covered EMC standards, principles of EM emission measurement techniques, advantages and disadvantages of EM emission measurement techniques, studies and applications of each technique, recommendations for which technique to be used, and challenges for future research in EM emission measurement. The final section of this paper discusses the challenges for near-field measurements related to the non-stationary emissions phenomenon. This papers also presents the challenges of how to detect and characterize them.

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