The dynamic fatigue behavior of the poly(ether-b-amide) (PEBA) elastomers was characterized by a combination
of step
increase load test (SILT), step increase strain test (SIST), and single
load dynamic creep (SLDC). PEBA had crystalline hard segments of polyamide
12 (PA12) and soft segments of poly(tetramethylene oxide) (PTMO).
The crystalline morphologies before and after the tests were studied
by ex situ wide-angle X-ray diffraction (WAXD) and small-angle X-ray
scattering (SAXS). Fast stress relaxation can be seen under the applied
strain well below than the elongation at break. Remarkable dynamic
creep can be observed under the applied load triggering yielding of
the specimen, which is substantially less than the ultimate tensile
strength. Although the presence of high content of amorphous PTMO
renders high entropic elasticity, the disintegration of the crystalline
hard domains of PA12 is expected to determine the relaxation rate,
creep rate, and modulus, as strain-induced crystallization in soft
domains did not occur and no trace was found by WAXD. SAXS patterns
showed that the orientation of the PA12 lamellae at lower stresses
or strains can largely be restored. However, the fractured and highly
aligned PA12 lamellae resulted in classic four-point or two-lobe SAXS
patterns, which implied the underlying microstructural changes after
the cyclic dynamic tests.