Microelectronics Reliability
 2021
DOI: 10.1016/j.microrel.2021.114279
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Influence of different test strategies on the power cycling test results of 6.5 kV SiC MOSFETs

M. Gerlach
1
,
Roman Boldyrjew-Mast
2
,
F. Bruchhold
3
et al.
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