Influence of Cr 2 O 3 thickness on the magnetic properties of NiFe/Cr 2 O 3 bilayers deposited on SrTiO 3 single-crystalline substrate

Interfacial spin structures in Pt/Tb3Fe5O12 bilayer films on Gd3Yadav, Bake, Lee et al. 2023Phys. Rev. MaterialsSelf Cite1000View full textAdd to dashboardCite

“…A commercial ULVAC-PHI PHI 5000 Versa Probe x-ray photoemission spectroscope (XPS) was used to determine the oxidation states of the Pt/TbIG/GGG thin films [23]. Polarized neutron reflectometry (PNR) was conducted using the PLATYPUS reflectometer at the Australian Nuclear Science and Technology Organisation (ANSTO).…”

Investigation of temperature dependence of magnetic properties of Cr$_2$O$_3$ thin film structure using a magnetic field imaging technique based on Nitrogen-Vacancy centres in diamond crystal

“…In this work we apply the magnetic field imaging technique to measure the changes in magnetic properties at phase transitions of Cr 2 O 3 thin film structures. Cr 2 O 3 is used in a number of thin film and nonstructural applications: changing magnetic properties of multilayer thin film systems [13][14][15][16], enhanced magnetoresistance properties [16][17][18], magnetoelectric random access memory [19], spin-current research [20,21] and even exotic spin superfluid research [22]. This material is favorable for a number of properties: relatively high magnetic susceptibility +1960 • 10 −6 cm 3 /mol, easy to reach NÃľel temperature at 34 • C and with it transition from antiferromagnetic to paramagnetic properties.…”