2008
DOI: 10.1016/j.surfcoat.2008.08.042
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Influence of bipolar pulsed DC magnetron sputtering on elemental composition and micro-structure of Ti–Al–Y–N thin films

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Cited by 26 publications
(28 citation statements)
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“…Shetty and Karimi [5] illustrated the crossover between the first developed c-TiN〈001〉 and the next c-TiN〈111〉 textures in thick (4.5 μm) single phase TiAlN film, deposited at high (possibly 650°C) substrate temperature. A crossover-like change in the orientation of c-TiN phase has been demonstrated in the 1.5-2 μm thick (Ti 1 − x Al x ) 1 − y Y y N films prepared at 500°C substrate temperature at oblique vapour beam incidence in the composition range in which the two-phase structure (cubic-TiN and wurtzite-AlN) developed and has been published in our earlier papers [6,7]. In these experiments a single phase c-TiAlN structure with Vshaped columnar morphology and 〈001〉 texture has been found at Ti/ Al ≥ 0.88.…”
Section: Introductionmentioning
confidence: 76%
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“…Shetty and Karimi [5] illustrated the crossover between the first developed c-TiN〈001〉 and the next c-TiN〈111〉 textures in thick (4.5 μm) single phase TiAlN film, deposited at high (possibly 650°C) substrate temperature. A crossover-like change in the orientation of c-TiN phase has been demonstrated in the 1.5-2 μm thick (Ti 1 − x Al x ) 1 − y Y y N films prepared at 500°C substrate temperature at oblique vapour beam incidence in the composition range in which the two-phase structure (cubic-TiN and wurtzite-AlN) developed and has been published in our earlier papers [6,7]. In these experiments a single phase c-TiAlN structure with Vshaped columnar morphology and 〈001〉 texture has been found at Ti/ Al ≥ 0.88.…”
Section: Introductionmentioning
confidence: 76%
“…With the target-substrate arrangement used in this facility (see Fig. 1 in [7]) only a small fraction of the vapour flux from the target section (directly below) arrives perpendicularly on the substrate, but the majority of vapour species is impinging at a certain angle with respect to the target-substrate axis. Therefore, tilted growth towards the vapour flux should be expected due to the oblique incident angles of the majority of the impinging metal species [17][18][19].…”
Section: Methodsmentioning
confidence: 99%
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