Influence of Annealing Temperature on Y_2O_3:SiO_2 Nanocomposite Prepared by Sol-Gel Process

Abstract

Oxide nanoparticles embedded in a polymer matrix produce nanocomposites which are useful for optics and electronic applications. Yttrium oxide nanoparticles have received much attention due to their various properties and are signicantly used in fundamental and application oriented elds. The present paper reports the inuence of annealing temperature on the Y2O3:SiO2 nanocomposite prepared by solgel process. Y(NO3)3·4H2O and tetraethoxysilane were used as precursors and obtained powdered form of Y2O3:SiO2 composite. The powder sample was annealed at 500• C and 900• C for 6 h which were characterized by X-ray diraction, Fourier transform infrared and transmission electron microscope. X-ray diraction data described that the broadening of peaks decreases with increase in annealing temperature which may be due to the increase in particle size. Sample analyzed by Fourier transform infrared and transmission electron microscopy conrmed the grain size dependence on annealing temperature. Cubic phase of yttrium oxide crystal structure was obtained within the silica matrix. The nanocrystallites size has been calculated using DebyeScherrer formula, WilliamsonHall plot and transmission electron micrographs and compared at two dierent temperatures (a) 500• C and (b) 900• C.

Yttrium oxide passivation of porous silicon nanostructures for improved photoluminescence and optoelectronic properties

“…The formation of Y-O-Si bonds have been reported and proved in previous studies[21]. The characteristic vibration bands of the Y-O bond (metal-oxygen) were observed at 562, 455[22,23] and 506 cm -1[24,25]. These bands have already been reported for Y2O3 thin films obtained by other techniques[23].…”

Toughening of highly translucent zirconia by monoclinic ZrO₂ and SiO₂ particle coating

“…Judging from the crystal size of ZrO2 in the coating, the SiO2 matrix prevented the crystal growth (or sintering) of mZrO2 nanoparticles; hence, the tetragonal phase was still observed for high SiO2 ratios. As for (2), a reaction between Y2O3 and SiO2 could occur above 1,000°C 27) , and the detached Y2O3 from PSZ probably moved into the coating layer through the SiO2 matrix to the stabilized tetragonal phase of ZrO2 in the coating layer.…”