Influence of an Applied Electric Field on the Conduction Characteristics of a Bithienyl-Capped Biphenylene and Biphenyl-Capped Oligothiophenes in Organic Field-Effect Transistor Structures

Abstract

Thin films (50 nm) of 2,5-di-4-biphenylthiophene (PPTPP), 5,5´-di-4-biphenylyl-2,2´-bithiophene (PPTTPP) and 4,4´-di-2,2´-bithienylbiphenyl (TTPPTT) were vapor-deposited on microstructured gold (source-and drain-) electrode arrays on thermal SiO 2 as gate dielectric with underlying Si serving as gate electrode. The films were studied in their field-effect characteristics during film growth and subsequent to it. A decay of specific conductivity and of charge carrier mobility was observed in subsequent measurements. During annealing without an applied field the films recovered but showed a second decay as soon as an electric field was applied again for repeated characterization. Induced dipoles and subsequent structural changes as well as chemical interactions with the SiO 2 interface are discussed as possible origins of these observations.