1985
DOI: 10.1016/0022-0248(85)90364-1
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Influence of acrt on interface stability and particle trapping behavior in directional solidification of silicon

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Cited by 20 publications
(16 citation statements)
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“…The carbon precipitation in solid is therefore neglected [15]. It has been reported [8] that the buoyancy-driven convection of melt flow in directional solidification of silicon is sufficient to keep small SiC particles suspended in the melt. It is therefore reasonable to assume that SiC particles are continuously distributed in the Si-melt and are mainly transported by melt convection.…”
Section: Sic Particle Precipitation Modelmentioning
confidence: 99%
See 1 more Smart Citation
“…The carbon precipitation in solid is therefore neglected [15]. It has been reported [8] that the buoyancy-driven convection of melt flow in directional solidification of silicon is sufficient to keep small SiC particles suspended in the melt. It is therefore reasonable to assume that SiC particles are continuously distributed in the Si-melt and are mainly transported by melt convection.…”
Section: Sic Particle Precipitation Modelmentioning
confidence: 99%
“…Since MG-Si feedstock contains a higher level of impurities, it is important to study the characteristics of carbon segregation and SiC particle precipitation in a directional solidification process. Some experimental studies [2,[6][7][8] on these characteristics have been carried out.…”
Section: Introductionmentioning
confidence: 99%
“…In ingot-grown mc-Si, this corresponds to material near the edges of the crucible, as well as near the bottom and the top of the ingot. Incidentally, these regions are also where the majority of metal silicide precipitates are observed, suggesting that unstable crystal growth 22 and high metal concentrations dissolving from growth surfaces favor the formation of these nanodefects.…”
Section: On the Size And Distribution Of Inclusionsmentioning
confidence: 99%
“…12,13 It has become clear that in order to fully assess the effect of metals on solar cell performance, one must know not only the total concentrations of different metal species, but also about the spatial and size distributions of metal-related defects, [14][15][16] their chemical natures, [15][16][17] their interactions with different types of defects, [18][19][20][21] and their behavior 22,23 during the crystal growth process. In this study, we employ synchrotron-based analytical techniques to determine the aforementioned characteristics of metal contamination in a variety of mc-Si materials from multiple vendors.…”
Section: Introductionmentioning
confidence: 99%
“…[1][2][3][4] There are many reports on the vertical and horizontal filmdrawing method [5][6][7] and the Czochralski method 8,9) for the manufacture technique of silicon for solar cell devices. 10) However, very few reports on the control of crystal orientation have been published, apart from some investigating the influences of convection 11) and impurities [12][13][14] on multicrystal silicon ingot processing. 15,16) To improve the quality of a multicrystal silicon ingot, it is necessary to remove impurities 3,17,18) and to clarify the mechanism by which the crystal grain grows to the appropriate size 19,20) because lattice defects and grain boundaries cause trapping of electrons and electron holes.…”
Section: Introductionmentioning
confidence: 99%