Infinite deflectometry enabling 2π-steradian measurement range

Graves, Logan R.; Quach, Henry; Choi, Heejoo; Kim, D. W.

doi:10.1364/oe.27.007602

Cited by 23 publications

(8 citation statements)

References 28 publications

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“…In addition, since the entire screen image is compressed into a small area on the sensor, the fringes become too bright and often cannot be resolved. In such cases one may need to enclose the inspected object by reference structures [157,170,338]. If large switchable structures are required, the method of choice is an array of projectors illuminating walls or scattering screens as in a "cave" [339].…”

Section: Setup Geometry and Sizementioning

confidence: 99%

Deflectometry for specular surfaces: an overview

Burke¹,

Pak²,

Höfer³

et al. 2022

Preprint

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Deflectometry as a technical approach to assessing reflective surfaces has now existed for almost 40 years. Different aspects and variations of the method have been studied in multiple theses and research articles, and reviews are also becoming available for certain subtopics. Still a field of active development with many unsolved problems, deflectometry now encompasses a large variety of application domains, hardware setup types, and processing workflows designed for different purposes, and spans a range from qualitative defect inspection of large vehicles to precision measurements of microscopic optics. Over these years, many exciting developments have accumulated in the underlying theory, in the systems design, and in the implementation specifics. This diversity of topics is difficult to grasp for experts and nonexperts alike and may present an obstacle to a wider acceptance of deflectometry as a useful tool in other research fields and in the industry.This paper presents an attempt to summarize the status of deflectometry, and to map relations between its notable "spin-off" branches. The intention of the paper is to provide a common communication basis for practitioners and at the same time to offer a convenient entry point for those interested in learning and using the method. The list of references is extensive but definitely not exhaustive, introducing some prominent trends and established research groups in order to facilitate further selfdirected exploration by the reader.

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Section: Setup Geometry and Sizementioning

confidence: 99%

Deflectometry for specular surfaces: an overview

Burke¹,

Pak²,

Höfer³

et al. 2022

Preprint

View full text Add to dashboard Cite

show abstract

“…Few people have devoted to reconstructing the 3D data of specular surfaces with large curvature. Craves et al 78 proposed a method using a conical mirror to measure roundness of a cylindrical surface so that the cylindrical surface can be transferred into a planar image. In order to further measure specular surfaces with high curvature, curved screens can be introduced into PMD systems.…”

Section: Complex Surfaces With Large Curvaturementioning

confidence: 99%

Phase measuring deflectometry for obtaining 3D shape of specular surface: a review of the state-of-the-art

et al. 2021

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Phase measuring deflectometry (PMD) is a superior technique to obtain three-dimensional (3D) shape information of specular surfaces because of its advantages of large dynamic range, noncontact operation, full-field measurement, fast acquisition, high precision, and automatic data processing. We review the recent advances on PMD. The basic principle of PMD is introduced following several PMD methods based on fringe reflection. First, a direct PMD (DPMD) method is reviewed for measuring 3D shape of specular objects having discontinuous surfaces. The DPMD method builds the direct relationship between phase and depth data, without gradient integration procedure. Second, an infrared PMD (IR-PMD) method is reviewed to measure specular objects. Because IR light is used as a light source, the IR-PMD method is insensitive to the effect of ambient light on the measured results and has high measurement accuracy. Third, a proposed method is reviewed to measure the 3D shape of partial reflective objects having discontinuous surfaces by combining fringe projection profilometry and DPMD. Then, the effects of error sources that mainly include phase error and geometric calibration error on the measurement results are analyzed, and the performance of the 3D shape measurement system is also evaluated. Finally, the future research directions of PMD are discussed.

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“…In addition, high curvature convex surfaces will make the reflected camera ray through the measured surface exceed the physical range of the display screen, which causes measurement failure. Graves et al located a convex surface on a rotating platform, and stitched segments of the surface [69]. This method can measure convex surfaces successfully but is time-consuming.…”

Section: Measurement Of High Curvature Changing Surfacesmentioning

confidence: 99%

A brief review of the technological advancements of phase measuring deflectometry

Gao

Jiang

2020

PhotoniX

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This paper presents a short review for phase measuring deflectometry (PMD). PMD is a phase calculation based technique for three-dimensional (3D) measurement of specular surfaces. PMD can achieve nano-scale form measurement accuracy with the advantages of high dynamic range, non-contact, full field measurement which makes it a competitive method for specular surface measurement. With the development of computer science, display and imaging technology, there has been an advancement in speed for PMD in recent years. This paper discusses PMD focusing on the difference on its system configuration. Measurement principles, progress, advantages and problems are discussed for each category. The challenges and future development of PMD are also discussed.

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Infinite deflectometry enabling 2π-steradian measurement range

Cited by 23 publications

References 28 publications

Deflectometry for specular surfaces: an overview

Deflectometry for specular surfaces: an overview

Phase measuring deflectometry for obtaining 3D shape of specular surface: a review of the state-of-the-art

A brief review of the technological advancements of phase measuring deflectometry

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