2021
DOI: 10.1002/smll.202008218
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Inelastic Electron Tunneling Spectroscopic Analysis of Bias‐Induced Structural Changes in a Solid‐State Protein Junction

Abstract: A central issue in protein electronics is how far the structural stability of the protein is preserved under the very high electrical field that it will experience once a bias voltage is applied. This question is studied on the redox protein Azurin in the solid‐state Au/protein/Au junction by monitoring protein vibrations during current transport under applied bias, up to ≈1 GV m−1, by electrical detection of inelastic electron transport effects. Characteristic vibrational modes, such as CH stretching, amide … Show more

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Cited by 6 publications
(11 citation statements)
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“…Underlying NDR is quantum tunneling across a barrier as this phenomenon is associated with getting the junction in and out of energetic resonance: in order to observe NDR, the applied voltage aligns empty (full) semiconductor (in our case protein) energy levels with full (empty) electrode levels, making them equi-energetic (ON resonance) or misaligning them (OFF resonance). The fact that NDR has been observed in the conductance–voltage characteristics of junctions of small proteins (∼2 nm) 35 further supports the operation of ETp by tunneling across these junctions.…”
Section: Is There Further Evidence For Etp Via Tunneling?mentioning
confidence: 63%
“…Underlying NDR is quantum tunneling across a barrier as this phenomenon is associated with getting the junction in and out of energetic resonance: in order to observe NDR, the applied voltage aligns empty (full) semiconductor (in our case protein) energy levels with full (empty) electrode levels, making them equi-energetic (ON resonance) or misaligning them (OFF resonance). The fact that NDR has been observed in the conductance–voltage characteristics of junctions of small proteins (∼2 nm) 35 further supports the operation of ETp by tunneling across these junctions.…”
Section: Is There Further Evidence For Etp Via Tunneling?mentioning
confidence: 63%
“…The fabrication procedure of the suspended gold-nanowire (AuNW)-based, non-destructive, top-electrode contact has been described in detail elsewhere. , Here, we slightly modified the procedure to increase the fraction of junctions where only a single AuNW is trapped within an array of microfabricated electrode devices (based on a chip developed by Noy et al) from ∼10 to ∼35% of all possible junctions on the chip. First, monolayers of the n -STV and t -STV proteins (or their respective biotin complexes) were prepared on the chip’s microelectrodes (bottom-electrode) as described above.…”
Section: Experimental Sectionmentioning
confidence: 99%
“…Based on the bias-dependent current responses, some junctions are classified as non-contact (current <10 pA @0.5 V), or shorted (current >1 mA @0.5 V), and the remaining are considered as active ones (10 pA < I < 50 μA @0.5 V). However, most junctions that pass >50 nA currents at 0.5 V were found to be shorted after a few scans and are considered to be partially shorted . The junctions with lower currents (30 pA < I < 50 nA @ 0.5 V) were noticeably less noisy than junctions with higher currents.…”
Section: Experimental Sectionmentioning
confidence: 99%
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