VLSI Design 2000. Wireless and Digital Imaging in the Millennium. Proceedings of 13th International Conference on VLSI Design
DOI: 10.1109/icvd.2000.812636
|View full text |Cite
|
Sign up to set email alerts
|

Inductance characterization of small interconnects using test-signal method

Abstract: Abstract

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
references
References 7 publications
0
0
0
Order By: Relevance