Inductance and Read-Write Characteristics for Thin Film Heads

Mitsuoka, K.; Iwakura, T.; Kobayashi, Tsutomu; Fukui, Hiroshi; Narishige, S.; Sugita, Y.

doi:10.1109/tjmj.1990.4564242

Cited by 2 publications

(3 citation statements)

References 5 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…1 (a)). Backgap saturation is believed to be the cause of this sharp drop-off in inductance [7]- [9]. The probabilities of popcorn noise in thii film heads may thus be inferred by measuring their inductance fluctuations as functions of DC bias current.…”

Section: (B)mentioning

confidence: 99%

“…A strong correlation was found among the induetance fluctuations, domain instabilities and popcorn noise probabilities. Peaks of the above parameters were observed in the range of 16 mA to 17.5 mA, which is believed to correspond to the onset of backgap saturation [7]- [9]. To verify the generality of this correlation, peak inductance fluctuations and peak popcorn noise probabilities were also obtained for 10 other heads.…”

mentioning

confidence: 99%

See 1 more Smart Citation

Inductance fluctuation, domain instability and popcorn noise in thin film heads

Liu

Kryder

1994

IEEE Trans. Magn.

View full text Add to dashboard Cite

3885Absrrucr -The mechanisms of popcorn noise in thin film heads were studied by correlating the inductance fluctuations under DC bias current, domain instabilities after write and popcorn noise probabilities.Inductance fluctuations of heads were obtained by calculating the standard deviations of the inductance values measured from 20 traces by a HP network analyzer.Instantaneous domain ' patterns during and after write a s well as popcorn noise probabilities of heads were observed by a 0.5-nsec exposure time wide-field Kerr effect microscope and a Barkhausen noise tester, respectively.A strong correlation was found among inductance fluctuations, domain instabilities and popcorn noise probabilities in a noisy head. This relationship w a s f u r t h e r confirmed by the quantitative correlation between the peak popcorn noise probabilities and peak inductance fluctuations of 12 different heads.Therefore, by measuring the inductance fluctuations of thin film heads under DC bias current, one can infer their susceptibilities to Barkhausen wall jumps, and thus popcorn noise p r o b a b i l i t i e s .

show abstract

Section: (B)mentioning

confidence: 99%

mentioning

confidence: 99%

Inductance fluctuation, domain instability and popcorn noise in thin film heads

Liu

Kryder

1994

IEEE Trans. Magn.

View full text Add to dashboard Cite

show abstract

“…In addition to the above investigations of popcorn noise mechanisms, the susceptibilities of micro Flexhead® components to Barkhausen wall jumps. thus to popcorn noise, were also measured electrically as inductance fluctuations under DC bias current [7][8][9].…”

Section: Introductionmentioning

confidence: 99%

Popcorn Noise in Micro Flexbead<sup>®</sup> Components

Liu

Louis²,

Anderson³

et al. 1994

J. Magn. Soc. Jpn.

View full text Add to dashboard Cite

---The effects of thermal transients after write, changes in stress-magnetostriction products and dynamic domain instabilities on popcorn noise probabilities in micro Flexhead® components were studied., It was observed that popcorn noise probabilities in micro Flexhead® components increase as the write current duration increases, until they saturate, with a specific write current amplitude. With increasing write current amplitude, the initial rate of change of noise probability with write current duration increases. In some cases where the resultant stress-magnetostriction products in micro Flexhead® components are negative, popcorn noise probabilities were observed to increase exponentially as functions of applied stress gradients. High rates of occurrence of dynamic domain instabilities have also been correlated with micro Flexhead® components that have high popcorn noise probabilities. Therefore. high probabilities of popcorn noise in micro Flexhead® components are caused by the combined effects of thermal transients after write, changes in stress-magnetostriction products and dynamic domain instabilities. Finally. an inductance fluctuation measurement technique was shown to be useful in quickly detecting micro Flexhead® components that are susceptible to popcorn noise.

show abstract

Inductance and Read-Write Characteristics for Thin Film Heads

Cited by 2 publications

References 5 publications

Inductance fluctuation, domain instability and popcorn noise in thin film heads

Inductance fluctuation, domain instability and popcorn noise in thin film heads

Popcorn Noise in Micro Flexbead<sup>®</sup> Components

Contact Info

Product

Resources

About

Inductance and Read-Write Characteristics for Thin Film Heads

Cited by 2 publications

References 5 publications

Inductance fluctuation, domain instability and popcorn noise in thin film heads

Inductance fluctuation, domain instability and popcorn noise in thin film heads

Popcorn Noise in Micro Flexbead<sup>&reg;</sup> Components

Contact Info

Product

Resources

About

Popcorn Noise in Micro Flexbead<sup>®</sup> Components