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2006
DOI: 10.1016/j.tsf.2006.01.019
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Indium sulfide thin films deposited by the spray ion layer gas reaction technique

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Cited by 58 publications
(56 citation statements)
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“…This might be due to an incomplete conversion of the precursor to the sulfide, which has been previously studied. 14 The detail spectra in Fig. 2͑a͒ reveal that the intensity of the CIGSSe related Na 1 s, Cu 2p…”
mentioning
confidence: 96%
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“…This might be due to an incomplete conversion of the precursor to the sulfide, which has been previously studied. 14 The detail spectra in Fig. 2͑a͒ reveal that the intensity of the CIGSSe related Na 1 s, Cu 2p…”
mentioning
confidence: 96%
“…The CIGSSe is formed by rapid thermal annealing of stacked elemental layers on Mo-coated soda-lime glass in a sulfur containing atmosphere. 13 For the preparation of the nominal In 2 S 3 layers, we used the Spray-ILGAR technique, 6,14 where a precursor solution is sprayed onto the heated absorber substrates followed by conversion of the solid film to a chalcogenide by a reactive gas. In the present study, the spray solution used is InCl 3 dissolved in ethanol and the reactive gas is H 2 S. A more detailed description can be found elsewhere.…”
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confidence: 99%
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“…The presence of Cl in indium sul¯de thin¯lms was observed before applying the ILGAR technique. 29 Barreau pointed out that residual precursor elements are common when using chemical deposition techniques. 30 A signi¯cant factor observed from the EDS analyses, was the ratio In:S (Table S1).…”
Section: Resultsmentioning
confidence: 99%
“…A radial ZnO / In 2 S 3 heterojunction was prepared by covering the nanorods with indium sulfide (In 2 S 3 ) using the Spray-ILGAR process described in (14). An ethanolic solution of 25 mmol/l indium chloride (Alfa Aesar, 99.99%) was sprayed for 30 sec.…”
Section: Methodsmentioning
confidence: 99%