2001
DOI: 10.1002/1521-3951(200111)228:1<173::aid-pssb173>3.0.co;2-r
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Indium Distribution within InxGa1?xN Epitaxial Layers: A Combined Resonant Raman Scattering and Rutherford Backscattering Study

Abstract: We report a Raman spectroscopy study performed at room temperature on In x Ga 1--x N epitaxial layers grown by metalorganic chemical vapour deposition on top of GaN/sapphire (0001) substrates. Resonant Raman measurements have been performed using excitation energies of 2.34, 2.54 and 3.02 eV. A shift of the A 1 (LO) phonon mode frequency was observed under different excitation energies. This is interpreted with respect to the composition and strain variations within the sample. The A 1 (LO) phonon line shape i… Show more

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