1969
DOI: 10.1107/s0567739469000283
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Indicators of accuracy in structure factor measurement

Abstract: Objective estimation of the error (o'Fmeas) in each structure factor (Fracas), by a procedure such as that outlined in Acta Cryst. (1964) 17, 1327, allows the indicator qle =-[z~ (A2Fmeas/a2Fmeas) + Z~_n,J 1:2 to be evaluated, where dF~e,~ = IFme~l -IFcald, Zm--n,~" 2 is given by the x 2 distribution at the e-significance level, and the model for which ZA2Fm~a~ is minimized contains m independent F~as and n variables. The sensitivity of ~'~ to errors in Fmeas is examined under both real and hypothetical condit… Show more

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Cited by 44 publications
(8 citation statements)
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“…Here, Te atoms are located at the Wyckoff site 2 d at ( x , y , z ) = (1/2, 2/3, z ) with z = 0.248 ± 0.001 and Cr atoms are located at the site 1 b (0 0 ½). We obtain a good unweighted residuum (Ru) 34 of 0.064 and a goodness of fit (GOF) 35 near 1.0 provided that a fraction of 0.40 ± 0.10 atoms per unit cell of intercalated Cr is located in the vdW gap at the Wyckoff site 1 a (0,0,0). On the basis of this structural model no significant improvement of the fit quality factors can be achieved by allowing for symmetry lowering such as e.g.…”
Section: Resultsmentioning
confidence: 94%
“…Here, Te atoms are located at the Wyckoff site 2 d at ( x , y , z ) = (1/2, 2/3, z ) with z = 0.248 ± 0.001 and Cr atoms are located at the site 1 b (0 0 ½). We obtain a good unweighted residuum (Ru) 34 of 0.064 and a goodness of fit (GOF) 35 near 1.0 provided that a fraction of 0.40 ± 0.10 atoms per unit cell of intercalated Cr is located in the vdW gap at the Wyckoff site 1 a (0,0,0). On the basis of this structural model no significant improvement of the fit quality factors can be achieved by allowing for symmetry lowering such as e.g.…”
Section: Resultsmentioning
confidence: 94%
“…Quantitative analysis of these data was carried out by a least‐squares refinement of the calculated intensities to those observed based on the SGR #156 ( P 3 m 1). An excellent fit could be achieved which is quantified by the goodness of fit (GOF) parameter of 1.06 [ 27 ] and the unweighted residuum (Ru) of 0.05 where Ru is defined as Ru = Σ||Fobs| – |Fcalc||/Σ|Fobs|, where the sum runs over all reflections. Ru represents the average relative deviation between the calculated (calc) and the experimental (obs) structure factor magnitudes.…”
Section: Resultsmentioning
confidence: 99%
“…In this context one might argue that the goodness-of-fit (GOF) parameter is the more suitable parameter for quantifying the fit quality. The GOF is given [46], where the difference between observed and calculated intensities is normalized to the uncertainties expressed by the standard deviation (σ ) and to (N − P ), i.e., the difference between the number of independent data points (N) and the number of parameters (P) which are varied. However, it should be noted that there are some issues, which are important and must critically be treated when the GOF is used in SXRD.…”
Section: A Data Analysismentioning
confidence: 99%