“…Methods such as Chevron Notch Beam (CNB) [ [11] , [12] , [13] ], Single-Edge Pre-cracked Beam (SEPB) [ 13 , 14 ], Single Edge Notch Beam (SENB) [ 14 , 15 ], Single Edge V-notch Beam (SEVNB) [ 16 , 17 ], Single Edge Laser Notch Beam (SELNB) [ 18 , 19 ], Double Cantilever Beam (DCB) [ [20] , [21] , [22] , [23] ], Wedge-insert Double Cantilever Beam (WDCB) [ 20 , 22 , 23 ], and End-Loaded Split (ELS) [ 24 , 25 ] are some of these techniques, and many of these methods have been used for many years to determine the K IC or K IFR of materials. In comparison, CFM is based on sharp indenters such as Vickers [ [26] , [27] , [28] , [29] , [30] ], Knoop [ [31] , [32] , [33] ], Berkovich [ 34 , 35 ], and Conical [ 36 ], which are applied to the sample in a certain period and amount of loading and are often used for brittle materials [ 34 , 36 ]. In general, the application of these techniques in the two groups varies according to the material, the manufacturing costs and testing of samples, and the required accuracy [ 3 ].…”