1997 IEEE Ultrasonics Symposium Proceedings. An International Symposium (Cat. No.97CH36118)
DOI: 10.1109/ultsym.1997.663316
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Incremental "model-build-test" validation exercise for a 1-D biomedical ultrasonic imaging array

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Cited by 24 publications
(18 citation statements)
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“…The resonance measurement technique involves observing the resonant and antiresonant frequencies of crystal samples of various geometries to derive the material constants directly related to the particular mode of vibration of each sample. (10,24,25) For the generation of clear resonance modes without mode coupling, the crystal resonators must have specific geometries suitable for particular modes of vibration. To identify the eleven independent material constants of the PMN-28%PT single crystals, six different resonators have been analyzed in this work: length extensional (LE), thickness extensional (TE), thickness shear (TS), and length thickness extensional (LTE) resonators, and two variations of the LTE resonators, XYt45° and ZXt45°.…”
Section: Resonator Measurementmentioning
confidence: 99%
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“…The resonance measurement technique involves observing the resonant and antiresonant frequencies of crystal samples of various geometries to derive the material constants directly related to the particular mode of vibration of each sample. (10,24,25) For the generation of clear resonance modes without mode coupling, the crystal resonators must have specific geometries suitable for particular modes of vibration. To identify the eleven independent material constants of the PMN-28%PT single crystals, six different resonators have been analyzed in this work: length extensional (LE), thickness extensional (TE), thickness shear (TS), and length thickness extensional (LTE) resonators, and two variations of the LTE resonators, XYt45° and ZXt45°.…”
Section: Resonator Measurementmentioning
confidence: 99%
“…To identify the eleven independent material constants of the PMN-28%PT single crystals, six different resonators have been analyzed in this work: length extensional (LE), thickness extensional (TE), thickness shear (TS), and length thickness extensional (LTE) resonators, and two variations of the LTE resonators, XYt45° and ZXt45°. (25,26) Each resonator was thus named to represent its principal resonant mode, adopting the definition and nomenclature given in the IEEE Standard on Piezoelectricity. (25,26) In the notation for the XYt45° resonator, the first character X means that the direction of the resonator thickness is along the crystal X axis, the second character Y means that the direction of the resonator length is along the crystal Y axis, and t45° means that the resonator is rotated around its thickness direction t by 45°.…”
Section: Resonator Measurementmentioning
confidence: 99%
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