2023
DOI: 10.1039/d2cp05797b
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Increasing the operating lifetime of green phosphorescent organic light emitting diodes by reducing charge accumulation at the interface

Abstract: The stability and degradation mechanism of phosphorescent organic light emitting diodes (OLEDs) have been an unsettled problem in the past decades. Here, we found that the electron accumulation at the...

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Cited by 3 publications
(2 citation statements)
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“…Researchers are developing new encapsulation techniques to shield OLEDs from elements that can cause damage [152]. One most promising technique is using flexible and transparent barrier materials that can protect OLEDs from oxygen and moisture while retaining excellent optical transparency [153]. The optimization of carrier accumulation at the hole-transporter/emission layer interface results in impressive characteristics, including a narrow emission spectrum, high color purity, and an extended operational lifetime [154].…”
Section: Accumulation Of Excessive Charge At Interfacesmentioning
confidence: 99%
“…Researchers are developing new encapsulation techniques to shield OLEDs from elements that can cause damage [152]. One most promising technique is using flexible and transparent barrier materials that can protect OLEDs from oxygen and moisture while retaining excellent optical transparency [153]. The optimization of carrier accumulation at the hole-transporter/emission layer interface results in impressive characteristics, including a narrow emission spectrum, high color purity, and an extended operational lifetime [154].…”
Section: Accumulation Of Excessive Charge At Interfacesmentioning
confidence: 99%
“…[ 43–57 ] This mechanistic understanding offered valuable insights for enhancing the operational longevity of OLEDs. [ 20,52,58–78 ]…”
Section: Introductionmentioning
confidence: 99%