Abstract:A post-silicon design validation methodology using on-die clock design for debug (DFD) circuits working together with advanced optical silicon probing techniques has been developed. Innovations are on increasing the nodal observability by using an infrared photon-emission (IREM) logic state image (LSI) technique and on increasing the nodal controllability by using a laser assisted device alternation (LADA) technique. This new approach provides a better solution for determining the root causes of marginal circu… Show more
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