2018
DOI: 10.1016/j.ultramic.2017.12.001
|View full text |Cite
|
Sign up to set email alerts
|

Increasing compositional backscattered electron contrast in scanning electron microscopy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
1
0
1

Year Published

2019
2019
2023
2023

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 12 publications
(2 citation statements)
references
References 10 publications
0
1
0
1
Order By: Relevance
“…[ 20 ] After spraying with TiO 2 , The asymmetric structure of CuS/TiO 2 could not be displayed intuitively, which may be due to the similar contrast of near atomic number of Cu and Ti in TEM images. [ 21 ] Therefore, the element mapping analysis was further employed to evaluate the Ti distribution on the nanoparticles. The elemental mapping images in Figure 1B demonstrated the asymmetric Ti distribution on the nanoparticles.…”
Section: Resultsmentioning
confidence: 99%
“…[ 20 ] After spraying with TiO 2 , The asymmetric structure of CuS/TiO 2 could not be displayed intuitively, which may be due to the similar contrast of near atomic number of Cu and Ti in TEM images. [ 21 ] Therefore, the element mapping analysis was further employed to evaluate the Ti distribution on the nanoparticles. The elemental mapping images in Figure 1B demonstrated the asymmetric Ti distribution on the nanoparticles.…”
Section: Resultsmentioning
confidence: 99%
“…Se mide el espesor obteniendo un valor promedio de 216 µm. Se percibe la presencia de un recubrimiento bien adherido y los nódulos de grafito La micrografía del sustrato y del recubrimiento tomada con electrones retrodispersados (figura 9) evidencia las diferencias de composición en cuanto a su densidad [20]. En la figura 10 (electrones secundarios) se muestra un aumento (zoom) de la zona de la interfaz entre el recubrimiento y el metal base.…”
Section: Caracterización Metalográficaunclassified