2009
DOI: 10.1049/el:20093380
|View full text |Cite
|
Sign up to set email alerts
|

InAsP/InGaAsP quantum-well 1.3 [micro sign]m vertical-cavity surface-emitting lasers

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

3
8
0

Year Published

2010
2010
2021
2021

Publication Types

Select...
4
2

Relationship

0
6

Authors

Journals

citations
Cited by 11 publications
(11 citation statements)
references
References 11 publications
3
8
0
Order By: Relevance
“…At elevated tempe− ratures, T 0 is equal to 51 K (T amb = 310-325 K) and 29 K (T amb = 330-345 K). These results are very close to their experimental values [11] of 83 K, 46 K, and 28 K, res− pectively.…”
Section: Resultssupporting
confidence: 89%
See 3 more Smart Citations
“…At elevated tempe− ratures, T 0 is equal to 51 K (T amb = 310-325 K) and 29 K (T amb = 330-345 K). These results are very close to their experimental values [11] of 83 K, 46 K, and 28 K, res− pectively.…”
Section: Resultssupporting
confidence: 89%
“…1) is similar to that reported by Lao et al [11]. The concept of the strain compensated multi−quantum−well (SCMQW) has been utilized.…”
Section: The Structuresupporting
confidence: 80%
See 2 more Smart Citations
“…However, it is difficult to grow the high quality distributed Bragg reflectors (DBRs), which are needed for VCSELs, based on InP, and complex approaches, such as wafer-bonding, are required. 2 Since DBRs at this wavelength are relatively easily grown on GaAs using GaAs/Al(GaAs) layer pairs, considerable effort has also been devoted to the development of GaAs-based active regions which emit near 1.3 lm. Examples include highly strained InGaAs, 3 InAs quantum dots, 4 and GaInNAs-based quantum wells (QWs) all of which have been the subject of extensive research.…”
Section: Introductionmentioning
confidence: 99%