In-the-field PID related experiences

Martínez‐Moreno, F.; Figueiredo, Gilberto; Lorenzo, E.

doi:10.1016/j.solmat.2017.09.037

Cited by 28 publications

(13 citation statements)

References 29 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The peak powers and open circuit voltages (Voc) of modules from 9 to 18 decrease remarkably in sequence. However, the short circuit currents of the PID-affected modules from the same module string have a slight change; this is consistent with some findings in the literature [18]. The closer a module is to the negative pole, the more serious is the power degradation of the PID-affected solar module.…”

Section: The Power Degradation Of Solar Modulessupporting

confidence: 91%

Investigation on Potential-Induced Degradation in a 50 MWp Crystalline Silicon Photovoltaic Power Plant

Huang

Li²,

Sun

et al. 2018

International Journal of Photoenergy

View full text Add to dashboard Cite

The regular performance deterioration of P-type crystalline silicon solar modules and module strings caused by potential-induced degradation in a photovoltaic power plant was found in the field. The PID-affected solar modules dismounted from the photovoltaic power plant were further investigated systematically in the laboratory. For the first time, we found that the neutral point of voltage in a module string moved forward to the positive pole for a PID-affected module string as time goes on. Even if low positive voltage is applied to a PID-prone module, it could cause PID. The thermographic and electroluminescence (EL) images of a PID-affected module string also exhibit a regular degradation pattern. This is in good agreement with the measured power loss of the dismounted solar modules under standard test conditions. The results obtained in this paper show that the maximum power degradation rate of solar modules was as high as 53.26% after only one year of operation because of PID in the field. Due to the vast amount of solar modules and incomplete recovery, this is a terrible catastrophe for the owner of a power plant and module producer.

show abstract

Section: The Power Degradation Of Solar Modulessupporting

confidence: 91%

Investigation on Potential-Induced Degradation in a 50 MWp Crystalline Silicon Photovoltaic Power Plant

Huang

Li²,

Sun

et al. 2018

International Journal of Photoenergy

View full text Add to dashboard Cite

show abstract

“…The RSD of the observed degradation is large (84%) suggesting that PID is a rather nonhomogeneous process. This is in coherence with other experiments . Nevertheless, the impact on STC power spread is still scarcely relevant (RSD increases just from 0.85% to 1.15%).…”

Section: Resultsmentioning

confidence: 99%

“…This is in coherence with other experiments. 23 Nevertheless, the impact on STC power spread is still scarcely relevant (RSD increases just from 0.85% to 1.15%).…”

Section: Pid Testsmentioning

confidence: 99%

Control of the STC power in PV modules' supplies for utility scale plants

Pérez

Coello

Lorenzo

2019

Progress in Photovoltaics

View full text Add to dashboard Cite

This article presents a specific procedure to control the standard test conditions (STC) power in photovoltaic (PV) modules. It also shows the results of its application on a supply of approximately 700 000 multicrystalline p‐type silicon BSF technology PV modules made by a worldwide known manufacturer (Tier‐1, Q4 2015). First, during the manufacturing process, the analysis of the STC power measurements of the whole supply carried out by the modules' manufacturer is included, where the quality of these measurements was evaluated through a comparative contrast study in an independent laboratory on a sample of 4000 modules. In addition, the light‐induced degradation (LID) on 180 modules and the resistance to the potential induced degradation (PID) in a sample of 125 modules were characterized and critically analyzed. Secondly, during operation phase, the analysis of the STC power after the first 2 years of operation of the modules in desert conditions was also included. These measurements were carried out on a sample of 2000 modules making use of an accredited mobile laboratory. The overall results showed the effectiveness of the implementation of the aforementioned procedure, which is based on the use of a set of reference modules (primary standards) with common calibration origin. It proved to be an effective way of reducing uncertainties all along the quality control process. The susceptibility to PID, as observed on the PID test (chamber method) specified in IEC TS 62804, was practically negligible, and the average LID degradation after 20 kWh/m2 of exposition to the sun was 1.5%. Finally, the degradation rate in the second year of operation was 0.32% with respect to the initial degradation occurred during the whole first year.

show abstract

“…When a point of the DC circuit of the PV system is grounded, a high electric potential difference between the solar cells and the frame of the modules can drive a mechanism known as potential induced degradation (PID). PID occurs in both crystalline silicon and thin film PV modules and can considerably compromise the performance of a PV system, especially if this operates at a high DC voltage [1]. PID can provoke catastrophic consequences in the operation of a PV system: in some cases, CIGS modules have essentially stopped functioning after bias application [2].…”

Section: Introductionmentioning

confidence: 99%

Experimental Evidence of PID Effect on CIGS Photovoltaic Modules

et al. 2020

View full text Add to dashboard Cite

As well known, potential induced degradation (PID) strongly decreases the performance of photovoltaic (PV) strings made of several crystalline silicon modules in hot and wet climates. In this paper, PID tests have been performed on commercial copper indium gallium selenide (CIGS) modules to investigate if this degradation may be remarkable also for CIGS technology. The tests have been conducted inside an environmental chamber where the temperature has been set to 85 °C and the relative humidity to 85%. A negative potential of 1000 V has been applied to the PV modules in different configurations. The results demonstrate that there is a degradation affecting the maximum power point and the fill factor of the current-voltage (I-V) curves. In fact, the measurement of the I-V curves at standard test condition show that all the parameters of the PV modules are influenced. This reveals that CIGS modules suffer PID under high negative voltage: this degradation occurs by different mechanisms, such as shunting, observed only in electroluminescence images of modules tested with negative bias. After the stress test, PID is partially recovered by applying a positive voltage of 1000 V and measuring the performance recovery of the degraded modules. The leakage currents flowing during the PID test in the chamber are measured with both positive and negative voltages; this analysis indicates a correlation between leakage current and power losses in case of negative potential.

show abstract

In-the-field PID related experiences

Cited by 28 publications

References 29 publications

Investigation on Potential-Induced Degradation in a 50 MWp Crystalline Silicon Photovoltaic Power Plant

Investigation on Potential-Induced Degradation in a 50 MWp Crystalline Silicon Photovoltaic Power Plant

Control of the STC power in PV modules' supplies for utility scale plants

Experimental Evidence of PID Effect on CIGS Photovoltaic Modules

Contact Info

Product

Resources

About