2019
DOI: 10.1016/j.actamat.2018.11.040
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In situ x-ray diffraction analysis of 2D crack patterning in thin films

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Cited by 22 publications
(18 citation statements)
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“…At higher strain, necks gradually transform into through-thickness cracks. The evolution of tensile-induced deformation can be evaluated using in situ atomic force microscopy (AFM), SEM, X-ray diffraction, or electrical resistance measurements. , Here, as the patterned area compared to the total gauge length is small, relating the resistance change to the patterned area of interest is challenging, and the highly textured Al films are not suitable for XRD and sin 2 Ψ analysis. Thus, for recording the evolution of tensile-induced deformations/cracks in the unpatterned Al foils, we perform in situ AFM measurements during tensile straining.…”
Section: Results and Discussionmentioning
confidence: 99%
“…At higher strain, necks gradually transform into through-thickness cracks. The evolution of tensile-induced deformation can be evaluated using in situ atomic force microscopy (AFM), SEM, X-ray diffraction, or electrical resistance measurements. , Here, as the patterned area compared to the total gauge length is small, relating the resistance change to the patterned area of interest is challenging, and the highly textured Al films are not suitable for XRD and sin 2 Ψ analysis. Thus, for recording the evolution of tensile-induced deformations/cracks in the unpatterned Al foils, we perform in situ AFM measurements during tensile straining.…”
Section: Results and Discussionmentioning
confidence: 99%
“…Cracking happens during tensile testing for metallic thin films on polymer substrates at relatively low deformation of about 3% for Ni [38] or Cu [39]. Even if cracks may be difficult to observe, no significant crack evidence has been reported for deformation up to 15% in very ductile materials such as gold [40].…”
Section: Evolution Of Twinned Volume During In Situ Deformation Testmentioning
confidence: 99%
“…While uniaxial testing does have significant merit, biaxial straining is more suited to the material system's application load. Furthermore, when combined with insitu X-ray diffraction (XRD) [1][2][3] multilayer film architectures can be examined more thoroughly by providing vital information about the mechanical behavior of different metals in multilayer nanolaminates [4,5]. Of further interest is to examine how the layer order of a simple bilayer system affects the mechanical behavior.…”
mentioning
confidence: 99%
“…It has already been demonstrated that the addition of brittle adhesion or protective films generally leads to an embrittlement of a normally ductile film compared to single ductile films under uniaxial loading [6][7][8][9]. However, only few studies investigated the mechanical behavior of material systems, such as Au, Ni, and W/Cu, under biaxial loading conditions [2,3,10,11].…”
mentioning
confidence: 99%
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