2014
DOI: 10.1016/j.intermet.2014.02.019
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In-situ thermal evolution of Ni/Ti multilayer thin films

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Cited by 30 publications
(22 citation statements)
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“…The phase composition after the heating cycle is the same for the Ni/Ti multilayer thin films with different L. However, it should be noted that the reaction temperature depend on L. For multilayer thin films with L of 12 and 4 nm, the reaction temperature is 350 and 385 C, respectively. This result was already observed during hot XRD experiments carried out with a laboratory x-ray source (Co radiation) for multilayer thin films grown on stainless steel [10]. However, in that study the presence of the NiTi 2 phase was not detected [10].…”
Section: In-situ Annealed Filmssupporting
confidence: 52%
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“…The phase composition after the heating cycle is the same for the Ni/Ti multilayer thin films with different L. However, it should be noted that the reaction temperature depend on L. For multilayer thin films with L of 12 and 4 nm, the reaction temperature is 350 and 385 C, respectively. This result was already observed during hot XRD experiments carried out with a laboratory x-ray source (Co radiation) for multilayer thin films grown on stainless steel [10]. However, in that study the presence of the NiTi 2 phase was not detected [10].…”
Section: In-situ Annealed Filmssupporting
confidence: 52%
“…This result was already observed during hot XRD experiments carried out with a laboratory x-ray source (Co radiation) for multilayer thin films grown on stainless steel [10]. However, in that study the presence of the NiTi 2 phase was not detected [10]. Using the Arrhenius plot of diffusivity, R. Gupta et al [18] calculated the activation energy for Ni/Ti multilayers with different bilayer periodicity.…”
Section: In-situ Annealed Filmsmentioning
confidence: 65%
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