2016
DOI: 10.1021/acs.nanolett.6b02926
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In Situ Study of Silicon Electrode Lithiation with X-ray Reflectivity

Abstract: Surface sensitive X-ray reflectivity (XRR) measurements were performed to investigate the electrochemical lithiation of a native oxide terminated single crystalline silicon (100) electrode in real time during the first galvanostatic discharge cycle. This allows us to gain nanoscale, mechanistic insight into the lithiation of Si and the formation of the solid electrolyte interphase (SEI). We describe an electrochemistry cell specifically designed for in situ XRR studies and have determined the evolution of the … Show more

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Cited by 70 publications
(100 citation statements)
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“…These previous studies show SEI layers with thicknesses between 30 and 280 Å depending on the cell chemistry. Finally, recent X-ray reflectivity studies on crystalline silicon indicate a 10 nm inorganic layer at the liquid-solid interface consistent with the ranges reported previously but still unable to probe the organic structure 49 .…”
Section: Introductionsupporting
confidence: 87%
“…These previous studies show SEI layers with thicknesses between 30 and 280 Å depending on the cell chemistry. Finally, recent X-ray reflectivity studies on crystalline silicon indicate a 10 nm inorganic layer at the liquid-solid interface consistent with the ranges reported previously but still unable to probe the organic structure 49 .…”
Section: Introductionsupporting
confidence: 87%
“…The Si wafer electrode was cycled at 50 µA cm −2 . The in situ electrochemical cell used for the XRR measurements was described in detail in our previous paper . The electrochemical profile obtained during the first lithiation, shown in Figures c and c, exhibits a small plateau near 0.6 V indicating initial SEI formation .…”
Section: Properties Of Sei and Lixsi Layer Before And After 3 H Restmentioning
confidence: 93%
“…In the present study, we track the reaction front between Si and Li x Si, as well as the structural properties of several reaction layers formed during Si (de)lithiation using in situ XRR. XRR is a surface and interface sensitive technique that can be carried out under realistic electrochemical conditions with a time resolution of minutes . Utilizing single crystal Si as a model electrode allows us to obtain sub‐nanometer resolution structural insights.…”
Section: Properties Of Sei and Lixsi Layer Before And After 3 H Restmentioning
confidence: 99%
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“…In recent years, a lot of research focused on the initial cycle of silicon electrodes to investigate the formation mechanism at the very starting of battery operation, which can accelerate the understanding of the usually observed large irreversible capacity loss. [36][37][38][39][40] Edström and co-workers demonstrated the interfacial mechanisms during charge and discharge, including surface silicon oxide change transformation, Li−Si alloying reaction, and formation of SEI layer. [41] As shown in Figure 3a, at the very beginning of discharge (0.5 V vs Li + /Li), a thin SEI layer has already formed but lithium has not yet reacted with silicon.…”
Section: Initial Coulombic Efficiencymentioning
confidence: 99%