In Situ Self-Fluorescence 3D Imaging of Micro/Nano Damage in Silicone Gel for Understanding Insulation Failure under High-Frequency Electric Fields
Xinyu Tang,
Wenxia Sima,
Potao Sun
et al.
Abstract:Strong
electromagnetic and heat flux stresses can induce severe
damage to solid insulation materials, leading to faults in power equipment
and power electronics devices. However, in the absence of suitable
in situ imaging methods for observing the development and morphology
of electrical damage within insulation materials, the mechanism of
insulation failure under high-frequency electric fields has remained
elusive. In this work, a recently discovered fluorescence self-excitation
phenomenon in electrical damag… Show more
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