1986
DOI: 10.1016/0022-3115(86)90091-7
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In-situ observation of cascade damage in gold under heavy ion irradiation at high temperature

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Cited by 39 publications
(16 citation statements)
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“…fully addressed. During ion-irradiation an increase in defect loss rate over those rates measured under similar conditions without ionirradiation has been observed [2,3]; this increase was reported to scale with influence. The immediate question arises as to whether a temperature dependence for the isothermal loss rate during ion-irradiation can account for the change in postirradiation yield.…”
Section: Introductionmentioning
confidence: 78%
“…fully addressed. During ion-irradiation an increase in defect loss rate over those rates measured under similar conditions without ionirradiation has been observed [2,3]; this increase was reported to scale with influence. The immediate question arises as to whether a temperature dependence for the isothermal loss rate during ion-irradiation can account for the change in postirradiation yield.…”
Section: Introductionmentioning
confidence: 78%
“…It is known that there are two and three lifetime components at 573 K and 673 K, respectively, indicating the varying nature of defect clusters. Ishino et al 10,27) claimed that vacancy-type loops and SFT could be observed by a combination of the bright-field and inside-outside techniques. We observed the same behavior in ion-irradiated gold.…”
Section: Instability Of Defect Clustersmentioning
confidence: 99%
“…A typical lifetime of SFT was several seconds or more, and that of the vacancy-type dislocation loops (V-clusters) was less than several seconds, as estimated in a previous work. 10) In addition to the above, we must note that tiny defects (a couple of nm) with much shorter lifetimes, lasting for several thirtieths of a second or less, were detected. These have not been previously reported, presumably because the WBDF technique enables higher spatial and time resolutions than those obtained by the bright-field technique.…”
Section: Instability Of Defect Clustersmentioning
confidence: 99%
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