2009
DOI: 10.1016/j.apsusc.2009.01.100
|View full text |Cite
|
Sign up to set email alerts
|

In situ observation of a Au (111) electrode surface using the X-ray reciprocal-lattice space imaging method

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2011
2011
2023
2023

Publication Types

Select...
4
1

Relationship

1
4

Authors

Journals

citations
Cited by 7 publications
(2 citation statements)
references
References 24 publications
(21 reference statements)
0
2
0
Order By: Relevance
“…For growth in ultra-high vacuum conditions, one should be able to do this by tuning temperature, the metal deposition flux, or an extra density of adatom clusters, [43][44][45] while for chemical growth situations one can tune the electrochemical potential and concentration. [46][47][48] These factors should enable one to select a particular period for the reconstruction, which in turn should enable one to obtain a nanotemplate with a required repeat distance.…”
Section: Evaluation Of R and Comparison With Experimentsmentioning
confidence: 99%
“…For growth in ultra-high vacuum conditions, one should be able to do this by tuning temperature, the metal deposition flux, or an extra density of adatom clusters, [43][44][45] while for chemical growth situations one can tune the electrochemical potential and concentration. [46][47][48] These factors should enable one to select a particular period for the reconstruction, which in turn should enable one to obtain a nanotemplate with a required repeat distance.…”
Section: Evaluation Of R and Comparison With Experimentsmentioning
confidence: 99%
“…The modified method of synchrotron-based reciprocalspace mapping uses a grazing-incidence geometry at a fixed azimuthal angle and produces a reciprocal-space map with a single X-ray exposure. The method was originally proposed for the quick evaluation of NiO nanowires on an ultra-smooth sapphire substrate (Sakata et al, 2004), Bi atomic lines buried in an Si interface (Sakata et al, 2005) and an Au electrode interface in an H 2 SO 4 solution (Sakata & Nakamura, 2009). The basic idea behind the method is that the diffraction conditions of the thin films can be represented by rods, which are perpendicular to the two-dimensional sample.…”
Section: Modified Synchrotron-based Reciprocal-space Mapping At a Fixmentioning
confidence: 99%