2014
DOI: 10.1002/aenm.201400975
|View full text |Cite
|
Sign up to set email alerts
|

In Situ Morphology Studies of the Mechanism for Solution Additive Effects on the Formation of Bulk Heterojunction Films

Abstract: and renewable or earth abundant materials. [ 1,2 ] For photovoltaic panels, the energy recovery time is the length of operation of a panel required to generate the energy used to manufacture the panel. In thin fi lm inorganic panels, this time has dropped to about one year. [ 3 ] One of the revolutionary appeals of roll-to-roll manufacturing of organic photovoltaics (OPV) is the potential to achieve energy recovery times as low as 10 d. [ 4 ] Tremendous advances have recently been made in OPV effi ciencies, [ … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

12
173
1

Year Published

2015
2015
2018
2018

Publication Types

Select...
8
1

Relationship

1
8

Authors

Journals

citations
Cited by 104 publications
(186 citation statements)
references
References 45 publications
(80 reference statements)
12
173
1
Order By: Relevance
“…during the drying process. 7,8 Therefore, gaining knowledge over the drying properties of polymer/fullerene thin films and correlating this information with the performance of lab-scale BHJs are essential in order to design better performing organic photovoltaic devices and transfer the manufacture protocols to large scale production. Over the past decade, a considerable amount of in situ characterization methods has been used to study drying dynamics and microstructure evolution of BHJs.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…during the drying process. 7,8 Therefore, gaining knowledge over the drying properties of polymer/fullerene thin films and correlating this information with the performance of lab-scale BHJs are essential in order to design better performing organic photovoltaic devices and transfer the manufacture protocols to large scale production. Over the past decade, a considerable amount of in situ characterization methods has been used to study drying dynamics and microstructure evolution of BHJs.…”
Section: Introductionmentioning
confidence: 99%
“…9 One of the most popular methods is white-light/laser reflectometry, using which the evolution of drying film thickness can be determined. 7,8,[10][11][12][13][14][15][16][17][18] Instead of reflectometry, some investigations have employed spectroscopic ellipsometry (SE), which is more sensitive to sub-nanometer regions, allowing the user to probe final stages of thin film drying. [19][20][21] Additionally, laser light and X-ray scattering techniques are used either as stand-alone methods or in combination with other optical methods.…”
Section: Introductionmentioning
confidence: 99%
“…The crystalline correlation length (CCL) and the relative crystallinity of the P3HT phase for each of the ternary blends have been calculated in Table S2. 39 The as-cast P3HT:IDTBR:60PCBM blend exhibits the lowest P3HT crystallinity and CCL (corresponding to the smallest crystallite size). P3HT:IDTBR:IDFBR exhibits the highest relative crystallinity amongst ternary films, indicating more pronounced polymer:small molecule phase separation for both the as-cast and annealed films.…”
Section: Morphology Picture Of the Ternary Blendsmentioning
confidence: 99%
“…Although examining structure preand post-processing is critical, a full understanding of structure development and chemical changes requires advanced in situ or in operando characterization that can probe dynamics and chemical kinetics. In situ and time-resolved investigations are more frequently done with hard X-rays [66,[100][101][102][103] since experiments do not need to be done under vacuum at these energies. The high vacuum chambers used for soft X-ray experiments makes in situ studies much more challenging, and further complications arise for scattering due to limitations on sample-detector distance.…”
Section: Simulating Resonant X-ray Scattering Patternsmentioning
confidence: 99%