In-situ Measurement of In-Plane and Out-of-Plane Force Gradient with a Torsional Resonance Mode AFM

Su, Chanmin; Huang, Lin; Neilson, Peter; Kelley, V. C.

doi:10.1063/1.1639717

Cited by 3 publications

(4 citation statements)

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“…All measurements were done in the tapping mode as the cantilever tip gently oscillated across the cross-sectional area of the measured samples. Hence, little or no tip was worn-out; this proves that no factor would limit the measurements [9,14]. During the measurements, a concise effect was made to ensure that the tip of the cantilever does not exceed the degradation frame of its tip coating.…”

Section: Towards Reaching the P-si:h/i-si:h/n-si:h Interfacesmentioning

confidence: 99%

“…The technique is illustrated by the famous distance-force curve. The curve shows a point to point fitting of the curve with the aid of the Derjaguin Muller and Toporov (DMT) model of elastic contact [14,16,21]. In this study, a special Atomic force microscopy (AFM) probing tip that had been calibrated was used to gain insight into the binding force existing between each interface.…”

Section: Adhesionmentioning

confidence: 99%

“…In Figure 4b, it is clear that there is a gradual decline in the adhesion force from the p-Si:H to n-Si:H region. Furthermore, peaks are also observed and this is an evidence of foreign (impurity) Derjaguin Muller and Toporov (DMT) model of elastic contact [14,16,21]. In this study, a special Atomic force microscopy (AFM) probing tip that had been calibrated was used to gain insight into the binding force existing between each interface.…”

Section: Adhesionmentioning

confidence: 99%

“…The adhesion degradation demonstrated above is unhealthy for a-Si:H solar module in terms of its output and durability. Adhesion degradation impacted negatively on the ability of a material to absorb photon energy; this is documented by Drijkoningen [14,22]. In addition, adhesion degradation between various layers affects interface binding energy and aids the delamination of the layers of solar cells.…”

Section: Adhesionmentioning

confidence: 99%

See 3 more Smart Citations

Mechanical Degradation Analysis of an Amorphous Silicon Solar Module

Osayemwenre

Meyer

2020

Energies

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This work examines the degradation of photovoltaic modules. It assesses the structural defects of amorphous silicon solar cells, which result from mechanical stress at nanoscale level. Firstly, it analyses the interface morphology, deformation, and internal delamination of a single junction amorphous silicon solar module. Secondly, it explores the interface deformation of the layers of the defective region of the module with some statistical tools including root mean root (RSM) and arithmetic mean (Rq). It used the aforementioned tools to demonstrate the effect of microstructural defects on the mechanical behaviour of the entire layers of the module. The study established that the defect observed in the module, emanated from long-term degradation of the a-Si solar cells after years of exposure to various light and temperature conditions. It tested the mechanism of mechanical degradation and its effect on the reliability and stability of the defective and non-defective regions of the module with adhesion force characterisation.

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Section: Towards Reaching the P-si:h/i-si:h/n-si:h Interfacesmentioning

confidence: 99%

Section: Adhesionmentioning

confidence: 99%

Section: Adhesionmentioning

confidence: 99%

Section: Adhesionmentioning

confidence: 99%

See 2 more Smart Citations

Mechanical Degradation Analysis of an Amorphous Silicon Solar Module

Osayemwenre

Meyer

2020

Energies

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Seeing is believing: atomic force microscopy imaging for nanomaterial research

Zhong

Yan

2016

RSC Adv.

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Interfacial assessment of degraded amorphous silicon module using scanning probe microscopy

Meyer

Osayemwenre

2020

Int J Mech Mater Eng

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This is a study of the degradation of amorphous silicon solar cells. The study accessed structural defects and the mechanical stress of solar cells at nanoscale level. Interface morphology, deformation, and internal delamination of the cells were analyzed. Adequate analysis of roughness parameters was performed to investigate the state of degradation of the amorphous silicon solar modules (a-Si:H) used in this study. Roughness parametric test is necessary in thin film solar cells production process because it is used to quantify the relationship that exists between roughness parameters and electrical efficiencies of solar cells. However, in this study, a roughness analysis was not only performed to quantify the performance of the a-Si:H module but to also compliment their mechanical degradation analysis. Roughness indicators such as root means square (RMS) roughness and average roughness were acquired from line profiles. Measurements were taken with scanning probe microscope (SPM) and PeakForce Quantitative Nanomechanical (QNM) technique was used through the cross sectional area of the analyzed samples. The method was validated with adhesive force and deformation analyses; it was established that high roughness values result from mechanical degradation. Results from the roughness parameters and the mechanical degradation analysis were further observed from in situ measurements and these showed good compatibility. The benefit of this technique is that it provides a good procedure for the evaluation of mechanical degradation without destroying any part of the intrinsic layers in a-Si:H modules.

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In-situ Measurement of In-Plane and Out-of-Plane Force Gradient with a Torsional Resonance Mode AFM

Cited by 3 publications

References 0 publications

Mechanical Degradation Analysis of an Amorphous Silicon Solar Module

Mechanical Degradation Analysis of an Amorphous Silicon Solar Module

Seeing is believing: atomic force microscopy imaging for nanomaterial research

Interfacial assessment of degraded amorphous silicon module using scanning probe microscopy

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