2016
DOI: 10.1016/j.jlumin.2015.12.016
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In-situ luminescence monitoring of ion-induced damage evolution in SiO2 and Al2O3

Abstract: a b s t r a c tReal-time, in-situ ionoluminescence measurements provide information of evolution of emission bands with ion fluence, and thereby establish a correlation between point defect kinetics and phase stability. Using fast light ions (2 MeV H and 3.5 He MeV) and medium mass-high energy ions (8 MeV O, E¼ 0.5 MeV/amu), scintillation materials of a-SiO 2 , crystalline quartz, and Al 2 O 3 are comparatively investigated at room temperature with the aim of obtaining a further insight on the structural defec… Show more

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Cited by 65 publications
(39 citation statements)
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“…High-purity, epi-polished, stoichiometric SrTiO 3 (001) single crystals, provided by MTI Corporation Ltd., were irradiated in the Ion Beam Materials Laboratory (IBML UT-ORNL) at the University of Tennessee, Knoxville [31]. The irradiation setup along with the temperature control and the spectroscopic characterization have been described previously [21][22][23]32,33]. The relevant irradiation parameters, including electronic excitation densities and total number of oxygen vacancies generated per incident ion [34], are summarized in Table 1 (also Supplemental Material).…”
Section: Methodsmentioning
confidence: 99%
“…High-purity, epi-polished, stoichiometric SrTiO 3 (001) single crystals, provided by MTI Corporation Ltd., were irradiated in the Ion Beam Materials Laboratory (IBML UT-ORNL) at the University of Tennessee, Knoxville [31]. The irradiation setup along with the temperature control and the spectroscopic characterization have been described previously [21][22][23]32,33]. The relevant irradiation parameters, including electronic excitation densities and total number of oxygen vacancies generated per incident ion [34], are summarized in Table 1 (also Supplemental Material).…”
Section: Methodsmentioning
confidence: 99%
“…The proper choice of ions with different masses and energies allows controlling the relative strength of electronic excitation and atomic collision processes, as well as the penetration depth of the excitation and structural damage [46][47][48]. As an example, a diagram of the installation available in the Ion Beam Materials Laboratory (IBML) at the University of Tennessee, Knoxville, TN, USA [45,49,50] is shown in Figure 2. amorphous samples suggesting that it is closely related to structural disorder [31,42,43].…”
Section: Luminescence Experimentsmentioning
confidence: 99%
“…Schematic of the experimental setup for in-situ ionoluminescence (IL) measurements reprinted from Crespillo et al[50], Copyright (2016), with permission from Elsevier.…”
mentioning
confidence: 99%
“…Most of the beam monitor consists of a fluorescent plate, enabling real time visualization of a beam spot on the plate. A SiO 2 plate, for example, has been used for beam monitoring because of strong emission [1][2][3][4][5] in the visible range when irradiated with MeV-ion beams. A Cr-doped Al 2 O 3 (e.g., AF995R, Desmarquest) is also suitable for beam profiling [6,7] for ion beams with energies larger than several hundred keV.…”
Section: Introductionmentioning
confidence: 99%