2008
DOI: 10.1002/smll.200800588
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In Situ Laser Synthesis of Si Nanowires in the Dynamic TEM

Abstract: The dynamic transmission electron microscope (DTEM) is introduced as a novel tool for in situ nanowire (NW) synthesis and characterization. Initial results show crystalline Si NW production by a root‐based growth mechanism using a pulsed laser ablation (PLA) method inside the microscope column (see image). The potential of the DTEM to characterize the evolution of nanostructures by PLA methods is demonstrated.

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Cited by 15 publications
(14 citation statements)
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“…The ability to study dynamic processes in materials on a timescale approaching 1 nanosecond is the main driving force behind the development of the dynamic transmission electron microscope (DTEM) at Lawrence Livermore National Laboratory (LLNL) [24][25][26][27][28][29][30]. To achieve this temporal resolution while still maintaining the direct high resolution imaging capability of a TEM, required the modification of a conventional TEM to create and control large electron bunches (containing ~10 9 electrons) -this development follows the groundbreaking research of Bostanjoglo and co-workers in this area [31][32][33].…”
Section: Introductionmentioning
confidence: 99%
“…The ability to study dynamic processes in materials on a timescale approaching 1 nanosecond is the main driving force behind the development of the dynamic transmission electron microscope (DTEM) at Lawrence Livermore National Laboratory (LLNL) [24][25][26][27][28][29][30]. To achieve this temporal resolution while still maintaining the direct high resolution imaging capability of a TEM, required the modification of a conventional TEM to create and control large electron bunches (containing ~10 9 electrons) -this development follows the groundbreaking research of Bostanjoglo and co-workers in this area [31][32][33].…”
Section: Introductionmentioning
confidence: 99%
“…First, the current DTEM at LLNL should be capable of incoherent imaging on the scale of ~10 ns and a few nm with the use of an ideal 100%-contrast sample. At present, the DTEM achieves better than 10-nm resolution in 15-ns exposures in conventional imaging, 29,30,[193][194][195][196] with real samples that inevitably have less than 100% contrast. Thus, the calculations seem to be reasonably close to reality in this indirect comparison.…”
Section: Resolution Limitations For Dtemmentioning
confidence: 99%
“…It is this approach that has been employed at LLNL using a modified JEOL 2000FX (Figure 35) that now achieves ~10 nm spatial resolution at a time resolution of ~15 ns ( Figure 36 and Figure 37). The lessons learned from the LLNL DTEM 29,30,[193][194][195] form the basis of the DTEM II design at UC-Davis and both instruments will aid in the design and implementation of a UTEM described here. …”
Section: Two Contrasting Modes Of Operation: Stroboscopic and Single mentioning
confidence: 99%
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