Broadly speaking, such strategies can be divided intn three categories. The first group, which are commonly labeled "ex-situm approaches, involve transfer ot the metal surface from the electrochemical cell into a vacuum chamber, with subsequent characterization by uhv-based approaches before possible return transfer and further electrochemical scrutiny (5,6]. This tactic has the obvious virtue of enabling the structure and composition of electrode surfaces to be examined in principle by the full range of "surface science" techniques in addition to separate characterization by electrochemical methods. A central limitation, however, is that the transfer of an intact electrochemical interface into uhv is fraught not only with technical difficulties, but also the solvent and some other interfacial components commonly evaporate into uhv at ambient temperatures.The alternative vacuum-based approach entails dosing various components of electrochemical interfaces from the gas phase onto a metal surface held aL a sufficiently low temperature in uhv. This "non-situ" approachI, commonly termed "uhv electrochemical modeling", enables ionic as well as neutral interfacial components to be dosed sequentially by employing appropriate ionizable and dipolar species, respectively, enabling their mutual influence to be explored by 1 This terminology was suggested, perhaps wryly, by Eric Stuve. We outline below some recent findings from in-situ experiments that at least in optimal cases provide significant new insight along these lines. It is appropriate beforehand to comment briefly on the nature of the in-situ techniques being utilized for this purpose.
NATURE OF IN-SITU PROBES IN SURFACE ELECTROCHEMISTRYAs Plready -1luded to. n major i=peeiment to the application of spectroscopic and other microscopic-level techniques to in-situ electrochemical interfaces lies in the need for the probe and resultant signal to traverse at least one of the adjacent bulk phases, usually the clctrelyte syt utien. The adaption of methods utilized in uhv surface science therefore commonly needs to contend with bulk-phase solution interferences, which can often obscure entirely